대한금속재료학회지 (Korean Journal of Metals and Materials)

  • 제50권12호
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  • Pages.867-871
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  • 2012
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  • 1738-8228(pISSN)
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  • 2288-8241(eISSN)
대한금속재료학회 (The Korean Institute of Metals and Materials)
권호 표지
DOI QR코드

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Texture Characteristics of TiN Film by Electron Backscatter Diffraction

  • Jeong, Bong-Yong (Future Convergence Ceramic Division, Korea Institute of Ceramic Engineering and Technology)
  • 투고 : 2012.06.26
  • 발행 : 2012.12.25
⟨ 이전 논문 다음 논문 ⟩

초록

The microstructure and texture of TiN coatings on a Ni-based super-alloy were characterized by the automated version of electron backscatter diffraction (EBSD), EBSD techniques were used to investigate the very fine TiN grain shape and crystal orientation. This study confirmed that EBSD techniques provide a very useful tool for characterization of coating materials. The TiN grains had a special texture, a {001}-fiber texture in the coating layer. It was also found that, in severe environments, the coating performance of equiaxial and randomly oriented TiN is superior to that with columnar structures.

키워드

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