Acknowledgement
Supported by : 한국연구재단
References
- H. Matsushita, Electromagnetic Shielding and Absorbing Practical Technology Practical Manual, p.185-189, Mimatsu Co. Tokyo (2006).
- S. Yoshida, M. Sato, E. Sugawara, and Y. Shimada, J. Appl. Phys. 85, 4636 (1999). https://doi.org/10.1063/1.370432
- S. T. Kim, Y. G. Park, and S. S. Kim, Met. Mater. Int. 14, 233 (2008). https://doi.org/10.3365/met.mat.2008.04.233
- K. S. Lee, Y. C. Yun, I. B. Jeong, and S. S. Kim, Mater. Sci. Forum 534-536, 1465 (2007).
- J. B. Kim and T. H. Noh, J. Kor. Inst. Met. & Mater. 47, 866 (2009).
- Y. Shimada, M. Yamaguchi, S. Ohnuma, T. Itoh, W. D. Li, S. Ikeda, K. H. Kim, and H. Nagura, IEEE Trans. Magn. 39, 3052 (2003). https://doi.org/10.1109/TMAG.2003.815892
- S. Ohnuma, H. Nagura, H. Fugimori, and T. Masumoto, IEEE Trans. Magn. 40, 2712 (2004). https://doi.org/10.1109/TMAG.2004.834240
- K. H. Kim, M. Yamaguchi, K. I. Arai, H. Nagura, and S. Ohnuma, J. Appl. Phys. 93, 8002 (2003). https://doi.org/10.1063/1.1558084
- N. Matsushita, T. Nakamura, and M. Abe, J. Appl. Phys. 93, 7133 (2003). https://doi.org/10.1063/1.1558198
- K. Kondo, T. Chiba, H. Ono, S. Yoshida, Y. Shimada, N. Matsushita, and M. Abe, J. Magn. Magn. Mater. 301, 107 (2005).
- S. H. Kim and S. S. Kim, J. Appl. Phys. 108, 024904 (2010). https://doi.org/10.1063/1.3456515
- H. One, T. Ito, S. Yoshida, Y. Takase, O. Hashimoto, and Y. Shimada, IEEE Trans. Magn. 40, 2853 (2004). https://doi.org/10.1109/TMAG.2004.832492