Journal of Applied Reliability (한국신뢰성학회지:신뢰성응용연구)

The Korean Reliability Society (한국신뢰성학회)
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Failure Analysis and Solution of ESD for Amplifier Used in Telecommunication

통신용 증폭기의 ESD 고장분석과 대책

  • Hwang, Soon-Mi (Reliability Technology Research Center, Korea Electronic Technology Institute) ;
  • Jung, Young-Baek (Reliability Technology Research Center, Korea Electronic Technology Institute) ;
  • Kim, Chul-Hee (Reliability Technology Research Center, Korea Electronic Technology Institute) ;
  • Lee, Kwan-Hoon (Reliability Technology Research Center, Korea Electronic Technology Institute)
  • 황순미 (전자부품연구원 신뢰성연구센터) ;
  • 정용백 (전자부품연구원 신뢰성연구센터) ;
  • 김철희 (전자부품연구원 신뢰성연구센터) ;
  • 이관훈 (전자부품연구원 신뢰성연구센터)
  • Received : 2011.07.28
  • Accepted : 2011.09.17
  • Published : 2011.09.25
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Abstract

Low-noise amplifier(LNA) is a component that amplifies the signal while lowering the noise figure of high-frequency signal. LNA holds a very important position in RF system so that it is widely used for telecommunication. Electro static discharge(ESD) is the most common cause of malfunction for low-powered components, such as Large Scale Integration and IC type LNA is weak in ESD. This thesis studies static effect of communication LNA. It analyzes ESD effect, which occurs within LNA circuit, and describes testing standard and methods. In order to find out LNA's susceptiblity to electro static, two well-recognized communication IC type LNA models were selected to be tested. Then static-induced malfunction was carefully analyzed and it suggests architectural problem and improvement from the LNA's ESD point of view.

Keywords

References

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