Nuclear Engineering and Technology

  • 제42권4호
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  • Pages.426-433
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  • 2010
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  • 1738-5733(pISSN)
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  • 2234-358X(eISSN)
한국원자력학회 (Korean Nuclear Society)
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MATERIAL INVESTIGATION AND ANALYSIS USING CHARACTERISTIC X-RAY

  • Oh, Gyu-Bum (Department of Radiologic Science, Korea University) ;
  • Lee, Won-Ho (Department of Radiologic Science, Korea University)
  • 투고 : 2009.12.30
  • 심사 : 2010.05.19
  • 발행 : 2010.08.31
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초록

The characteristic X-rays emitted from materials after gamma ray exposure was simulated and measured. A CdTe semiconductor detector and a $^{57}Co$ radiation source were used for energy spectroscopy. The types of materials could be identified by comparing the measured energy spectrum with the theoretical X-ray transition energy of the material. The sample composition was represented by the $K_{\alpha1}$-line (Siegbahn notations), which has the highest intensity among the characteristic X-rays of each atom. The difference between the theoretic prediction and the experimental result of K-line measurement was < 0.61% even if the characteristic X-rays from several materials were measured simultaneously. 2D images of the mixed materials were acquired with very high selectivity.

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참고문헌

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피인용 문헌

  1. Atomic spectrometry update-X-ray fluorescence spectrometry vol.26, pp.10, 2011, https://doi.org/10.1039/c1ja90038b
  2. Fluorescence X-ray computed tomography (FXCT) using a position-sensitive CdTe detector vol.64, pp.1, 2014, https://doi.org/10.3938/jkps.64.122