Analysis of Symmetric Coupled Line with Crossbar Embedded Structure for Improved Attenuation Characteristics on the Various Lossy Media

다양한 매질내의 손실특성 개선을 위한 크로스바 구조의 대칭 결합선로에 대한 해석

  • Kim, Yoon-Suk (Electronics Engineering, Korea Air Force Academy)
  • 김윤석 (공군사관학교 전자공학과)
  • Received : 2010.02.05
  • Accepted : 2010.08.13
  • Published : 2010.08.25

Abstract

A characterization procedure for analyzing symmetric coupled MIS(Metal-Insulator-Semiconductor) transmission line is used the same procedure as a general single layer symmetric coupled line with perfect dielectric substrate from the extraction of the characteristic impedance and propagation constant for even- and odd-mode. In this paper, an analysis for a new substrate shielding symmetric coupled MIS structure consisting of grounded crossbar at the interface between Si and SiO2 layer using the Finite-Difference Time-Domain (FDTD) method is presented. In order to reduce the substrate effects on the transmission line characteristics, a shielding structure consisting of grounded crossbar lines over time-domain signal has been examined. Symmetric coupled MIS transmission line parameters for even- and odd-mode are investigated as the functions of frequency, and the extracted distributed frequency-dependent transmission line parameters and corresponding equivalent circuit parameters as well as quality factor for the new MIS crossbar embedded structure are also presented. It is shown that the quality factor of the symmetric coupled transmission line can be improved without significant change in the characteristic impedance and effective dielectric constant.

일반적으로 MIS(도체-부도체-반도체)의 다층 구조로 이루어진 대칭 결합선로에 대한 해석 절차는 모드(even and odd) 해석에 기초한 특성임피던스와 전파상수를 추출함으로서 단층의 결합선로 해석 절차와 동일하다. 본 논문에서는 손실매질의 다층구조로 이루어진 마이크로 스트립선로의 손실특성의 개선을 위한 새로운 구조를 제안한다. MIS 구조로 된 전송선로의 Si와 SiO2층 사이에 0전위를 가진 도체를 일정한 간격의 주기적인 배열로 고안된 새로운 모델의 MIS구조에 대한 유한차분법을 이용한 해석방법이 사용된다. 특히 전송선로에 대한 유전체의 영향을 줄이기 위하여 0전위를 가진 주기적인 결합의 도체로 이루어진 구조가 시간영역의 신호를 통해 시험된다. 다양한 손실률을 가진 불완전 유전체에 따른 주파수 의존적인 추출된 전송선로 파라미터와 등가회로 파라미터가 주파수 함수로서 나타내진다. 특히 본 논문에서 제안한 새로운 구조의 불완전 유전체에 대한 전송선로 파라미터가 주파수 함수로 구해진다.

Keywords

References

  1. H. Guckel and I. Palocz, "A parallel-plate waveguide approach to micro-miniaturized planar transmission lines for integrated circuits," IEEE Trans. MTT, vol. 15, pp. 468-476, Aug. 1967. https://doi.org/10.1109/TMTT.1967.1126505
  2. H. Hasegawa and H. Yanai, "Properties of microstrip line on Si-SiO2 system", IEEE Trans. MTT, vol. 19, pp. 869-881, Nov. 1971. https://doi.org/10.1109/TMTT.1971.1127658
  3. V. Tripathi and R. Bucolo, "A simple network analog approach for the quais-static characteristics of general lossy, anisotropic, layered structures," IEEE Trans. MTT, vol. 33, pp. 1458-1464, Dec. 1985. https://doi.org/10.1109/TMTT.1985.1133240
  4. M. Iskander and T. Lind, "Electromagnetic coupling of coplanar waveguides and microstrip lines to highly lossy dielectric media," IEEE Trans. MTT, vol, 37 pp. 1910-1917, Dec. 1989. https://doi.org/10.1109/22.44102
  5. K. Goossen and R. Hammond,"Modeling of picosecond pulse propagation in microstrip interconnections on integrated circuits," IEEE Trans. MTT, vol. 37 pp. 469-478, Mar. 1989. https://doi.org/10.1109/22.21616
  6. S. Seki and H. Hasegawa, "Analysis of crosstalk in very high-speed LSI/VLSI's using a coupled multi-conductor MIS microstrip line model," IEEE Trans. MTT, vol. 32, pp. 1715-1720, Dec. 1984. https://doi.org/10.1109/TMTT.1984.1132920
  7. J. Gilb and C. Balanis, "Asymmetric multiconductor low-coupling structures for high-speed, high-density digital interconnects," IEEE Trans. MTT, vol.39, pp. 2100-2106, Dec. 1991. https://doi.org/10.1109/22.106552
  8. V. Tripathi and R. Bucolo, "Analysis and modeling of multilevel parallel and crossing interconnection lines," IEEE Trans. ED, vol. 34, pp. 650-658, Mar. 1987. https://doi.org/10.1109/T-ED.1987.22976
  9. Y. Kim and V.K. Tripathi, "Extraction of multiple coupled line parameters using the FDTD simulation," IEE Proc. Micro. Antennas and Prop., vol. 146,pp. 443-446, Dec. 1999. https://doi.org/10.1049/ip-map:19990717
  10. Y. Kim, "Analysis of transmission on Si-based lossy structure using the FDTD method," Journal of KICS. vol. 25, pp. 1527-1533, Sept. 2000.
  11. Y. Kim, "Characterization of multiple coupled line structures on multi-layered substrate using FDTD technique." Journal of KIMST. vol. 4. pp. 155-163, July, 2000.
  12. Y. Kim, "Analysis of a new crossbar embedded structure for improved attenuation characteristics on the various lossy media." Journal of the IEEK, vol. 43-TC, pp. 83-88, Dec. 2006.