JSTS:Journal of Semiconductor Technology and Science

  • 제9권1호
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  • Pages.61-66
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  • 2009
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  • 1598-1657(pISSN)
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  • 2233-4866(eISSN)
대한전자공학회 (The Institute of Electronics and Information Engineers)
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Investigation of Frequency Dependent Sensitivity of Noise Figure on Device Parameters in 65 nm CMOS

  • Koo, Min-Suk (Inter-University Semiconductor Research Center (ISRC), and School of Electrical Engineering, Seoul National University) ;
  • Jung, Hak-Chul (Inter-University Semiconductor Research Center (ISRC), and School of Electrical Engineering, Seoul National University) ;
  • Jhon, Hee-Sauk (Inter-University Semiconductor Research Center (ISRC), and School of Electrical Engineering, Seoul National University) ;
  • Park, Byung-Gook (Inter-University Semiconductor Research Center (ISRC), and School of Electrical Engineering, Seoul National University) ;
  • Lee, Jong-Duk (Inter-University Semiconductor Research Center (ISRC), and School of Electrical Engineering, Seoul National University) ;
  • Shin, Hyung-Cheol (Inter-University Semiconductor Research Center (ISRC), and School of Electrical Engineering, Seoul National University)
  • 발행 : 2009.03.31
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초록

We have investigated the noise sensitivity of low noise amplifier (LNA) at different frequency. This noise sensitivity analysis provides insights about noise parameters and it is very beneficial for making appropriate design trade-offs. From this work, the circuit designer can choose the adequate noise parameters tolerances.

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참고문헌

  1. B. Razavi, "RF microelectronics," Prentice Hall, USA, 1998
  2. H. Jung, H. Jhon, I. Song, M. Koo, and H. Shin, "Design optimization of a 10 GHz Low Noise Amplifier with gate drain capacitance consideration in 65 nm CMOS Technology," IEEE International Conference on Solid State and Integrted Circuit Technology, pp.1480-1483, 2008
  3. J. Jeon, J. Lee, C. Park, J Yoon, H. Lee, H. Oh, B.-G. Park, and H. Shin, "Accurate Channel Thermal Noise Modeling in BSIM4," International Conference on Solid State Devices and Materials, pp. 490-491, 2008
  4. J. Jeon, J.D. Lee, B.-G. Park, and H. Shin, "Analytical noise parameter model of short-channel RF MOSFETs," International Conference on Solid State Devices and Materials, pp. 490-491, 2008
  5. M. Koo, I. Song, J. Jeon, H. Jhon, and H. Shin, Korean Conference on Semiconductors, p.108 (2008)
  6. Saman Asgaran, M. Jamal Deen, and Chih-Hung Chen, IEEE Transaction on Circuit and Systems, vol.54, no.3, (2007)