DOI QR코드

DOI QR Code

INVESTIGATION ON THE CORROSION BEHAVIOR OF HAHA-4 CLADDING BY OXIDE CHARACTERIZATION

  • Park, Jeong-Yong (Fusion Technology Division, Korea Atomic Energy Research Institute) ;
  • Choi, Byung-Kwon (Fusion Technology Division, Korea Atomic Energy Research Institute) ;
  • Jeong, Yong-Hwan (Fusion Technology Division, Korea Atomic Energy Research Institute)
  • Published : 2009.03.30

Abstract

The microstructure, the corrosion behavior and the oxide properties were examined for Zr-1.5Nb-0.4Sn-0.2Fe-0.1Cr (HANA-4) alloys which were subjected to two different final annealing temperatures: $470^{\circ}C$ and $570^{\circ}C$. HANA-4 was shown to have $\ss$-enriched phase with a bcc crystal structure and Zr(Nb,Fe,Cr)$_2$ with a hcp crystal structure with $\ss$-enriched phase being more frequently observed compared with Zr(Nb,Fe,Cr)$_2$. The corrosion rate of HANA-4 was increased with an increase of the final annealing temperature in the PWR-simulating loop, $360^{\circ}C$ pure water and $400^{\circ}C$ steam conditions, which was correlated well with a reduction in the size of the columnar grains in the oxide/metal interface region. The oxide growth rate of HANA-4 was considerably affected by the alloy microstructure determined by the final annealing temperature.

Keywords

References

  1. Y. H. Jeong, S. Y. Park, M. H. Lee, B. K. Choi, J. H. Baek, J. Y. Park, J. H. Kim and H. G. Kim, J. Nucl. Sci. Tech., 43, 977 (2006). https://doi.org/10.3327/jnst.43.977
  2. G. P. Sabol, J. ASTM Int., 2, Paper ID JAI12942 (2005). https://doi.org/10.1520/JAI12942
  3. P. Bossis, D. Pecheur, K. Hanifi, J. Thomazet and M. Blat, J. ASTM Int., 3, Paper ID JAI12404 (2006). https://doi.org/10.1520/JAI12404
  4. J. Y. Park, S. J. Yoo, B. K. Choi and Y. H. Jeong, J. Alloy & Com., 437, 274 (2007). https://doi.org/10.1016/j.jallcom.2006.07.101
  5. A. Yilmazbayhan, E. Breval, A. T. Motta and R. J. Comstock, J. Nucl. Mater., 349, 265 (2006). https://doi.org/10.1016/j.jnucmat.2005.10.012
  6. A. T. Motta, A. Yilmazbayhan, R. J. Comstock, J. Partezana, G. P. Sabol, B. Lai and Z. Cai, J. ASTM Int., 2, Paper ID JAI12375 (2005). https://doi.org/10.1520/JAI12375
  7. J. Y. Park, B. K. Choi, S. Y. Yoo and Y. H. Jeong, J. ASTM Int., 5, Paper ID JAI101129 (2008). https://doi.org/10.1520/JAI101129