전자공학회논문지 IE

The Institute of Electronics and Information Engineers (대한전자공학회)
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An Image Processing Technique for Polarizing Film Defects Detection

편광필름 결함검출을 위한 영상처리기법

  • Sohn, Sang-Wook (Department of Electrical Engineering, Chungbuk National University) ;
  • Ryu, Geun-Taek (Department of Biomedical Engineering, Keukdong College) ;
  • Bae, Hyeon-Deok (Department of Electrical Engineering, Chungbuk National University)
  • Published : 2008.06.25
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Abstract

In this paper, we propose a new image processing technique that reliably detects the various defects of TFT-LCD polarizing films. The image of polarizing film is acquisited from reflected laser beam First, we apply the morphological image processing technique to remove the background noise. Next, we use the 2-dimensional LMS adaptive filtering and statistical characteristics to detect the white and black defects. Performance of the proposed method is evaluated on real TFT-LCD polarizing film samples.

본 논문에서는 TFT-LCD 편광필름의 결함을 검출하기 위한 새로운 영상처리기법을 제안한다. 레이저 반사광을 이용하여 획득한 편광필름 영상에서 우선 배경잡음을 제거하기 위하여 형태론적 영상처리기법(열림, 닫힘)을 사용한다. 배경잡음이 제거된 영상으로부터 결함을 검출하기 위하여 2차원 LMS 적응 예측기를 사용하여 밝은 결함을 검출하고 통계적 특성을 이용하여 어두운 결함을 검출한다. 산업현장에서 제공된 TFT-LCD 편광필름을 사용하여 제안된 기법의 성능을 평가한다.

Keywords

References

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