참고문헌
- A. E. Delahoy and M. Cherny, Master. Res. Soc. Symp. Proc., 426, 467 (1996) https://doi.org/10.1557/PROC-426-467
- Junqing Zhao, Shijie Xie, Shenghao Han, Zhiwei Yang, Lina Ye, and Tianlin Yang, Synthetic Metals, 144(3), 251-254 (2000)
- Natela R. Aghamalyan, Rubon K. Hovsepyan and Armen R. Poghosyan Proc. SPIE Int. Soc. Opt. Eng., 161, 5520 (2004)
- Z. K. Tang, P. Yu, G. K. L. Wang, M. Kawasaki, A. Ohtomo, H. Koinuma and Y. Segawa, Solid State Commun, 103(8), 459(1997) https://doi.org/10.1016/S0038-1098(97)00216-0
- Navina Mehan, Kondepudy Sreenivas and Abhai Mansingh Proc. SPIE Int. Soc. Opt. Eng., 251, 5415 (2004)
- Q. H. Li, Y. X. Liang, Q. Wan and T. H. Wang, Appl. Phys. Lett., 85(24), 5923 (2004) https://doi.org/10.1063/1.1836870
- S. J. Pearton, D. P. Norton, K. Ip, Y. W. Heo and T. Steiner, Progress in Materials Science., 50(3),293 (2005) https://doi.org/10.1016/j.pmatsci.2004.04.001
- D. C Look, G. M. Reniund, R. H. Brugener and J. R. Sizelove. Appl. Phys. Lett., 85(24), 5269 (2004) https://doi.org/10.1063/1.1825615
- Oshihiro Miyata, Satoshi Ida and Tadatsugu Minami. J. Vac. Sci. Technol., A 21(4), 1404, (2003) https://doi.org/10.1116/1.1580492
- Alexander I. Khudobenko, Alexander N. Zherikhin, R. T. Williams, J. Wilkinson, K. B. Ucer, G. Xiong and V. V. Voronov. Proc. SPIE Int. Soc. Opt. Eng., 317, 5121 (2003)
- Xiang Liu, Xiaohua Wu, Hui Cao and R. P. H. Chang, J. Appl. Phys., 95(6), 3141 (2004) https://doi.org/10.1063/1.1646440
- Agus Setiawan, Zahra Vashaei et al. J. Appl. Phys., 96(7), 3763 (2004) https://doi.org/10.1063/1.1785852
- N. Serpone, D. Lawless and R. Khairutdinow J. Phys. Chem., 99, 16646 (1995) https://doi.org/10.1021/j100045a026
- I. K. El Zawawi, R. A. Abd Alla, Thin Solid Films, 339, 314, (1999) https://doi.org/10.1016/S0040-6090(98)01324-8
- Haisheng San, Bin Li, Boxue Feng, Yuyang He and Chong Chen, Thin Solid Films, 483(1), 245 (2005) https://doi.org/10.1016/j.tsf.2004.12.028
- K. L. Chopra, S. Major and D. K. Pandya, Thin Solid Films, 102(1), 1 (1983) https://doi.org/10.1016/0040-6090(83)90256-0
- Milton Ohring, in Materials Science of Thin Films, ACADEMIC, second edition, p. 176