Journal of the Korean Institute of Electrical and Electronic Material Engineers (한국전기전자재료학회논문지)

The Korean Institute of Electrical and Electronic Material Engineers (한국전기전자재료학회)
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Study on the Quantitativity of Image Sticking in the Fringe-field Switching(FFS) Mode

Fringe-Field Switching (FFS) 모드에서 잔상 정량화에 관한 연구

  • 신승민 (BOE_TFT_LCD_SBU 선행 기술그룹) ;
  • 김미숙 (BOE_TFT_LCD_SBU 선행 기술그룹) ;
  • 정연학 (BOE_TFT_LCD_SBU 선행 기술그룹) ;
  • 김향율 (전북대학교 신소재공학부) ;
  • 김서윤 (BOE_TFT_LCD_SBU 선행 기술그룹)
  • Published : 2005.08.01
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Abstract

We studied the quantitativity of the image sticking which is occured by the resicual DC in the fringe-electric field switching (FFS) mode. Actually, in the FFS mode driven by the strong fringe electric field, the asymmetric residual DC was formed in the bottom substrate. It made the impurity ion stick to the alignment layer such as polyimde layer. Thus, the differnece of the luminance existes after the stress check pattern is applied to the panel so that we can see the image sticking. This image sticking decreases as the residual DC value between specific patterns decreases. Therefore, it is necessary to control the residual DC for the FFS mode with the high image quality. It is possible to eliminate the image stiking when the extra pixel voltage is applied through the circuit tunning for reducing the difference of residual DC accroding to the panel position.

Keywords

References

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