Abstract
This study investigated the crystal growth, crystalline structure and the basic optical properties of $PbSnSe/BaF_2$ epilayers. The PbSnSe epilayer was grown on $BaF_2$(111) insulating substrates using a hot wall epitaxy (HWE) technique. It was found from the analysis of X-ray diffraction patterns that $PbSnSe/BaF_2$ epilayer was grown single crystal with a rock-salt structure oriented along [111] the growth direction. Using Rutherford back scattering, the atomic ratios of the PbSnSe was found to be proper stoichiometric. The best values for the full width at half maximum (FWHM) of the DCXRD was 162 arcsec for PbSnSe epilayer. The epilayer-thickness dependence of the FWHM of the DCXRD shows that the quality of the $PbSnSe/BaF_2$ is as expected. The dielectric function ${\varepsilon}(E)$ of a semiconductor is closely related to its electronic energy band structure and such relation can be drawn from features around the critical points(CPs) in the optical spectra. The real and imaginary parts(${\varepsilon}1$ and ${\varepsilon}2$) of the dielectric function ${\varepsilon}$ of PbSe were measured, and the observed spectra reveal distinct structures at energies of the E1, E2 and E3 CPs. These data are analyzed using a theoretical model known as the model dielectric function (MDF). The optical constants related to dielectric function such as the complex refractive index ($n^*=n+ik$), absorption coefficient (${\alpha}$) and normal-incidence reflectivity (R) are also presented for $PbSnSe/BaF_2$.
IV-VI족 화합물인 PbSnSe는 흥미 있는 물리적 특성을 가지고 있는 화합물 반도체로써 본 실험에서는 HWE 방법으로 성장시킨 PbSnSe 박막에 대한 특성을 조사하였다. 원료부와 열벽부 그리고 기판의 온도를 변화시키며 단결정 박막을 성장시켰다. Rutherford back scattering (RBS)을 측정하여 Pb:Sn:Se의 조성비를 확인하였다. 특히 좁은 에너지 대역을 측정하기에 매우 용이한 Fourier transform infra red (FT-IR)측정 장치를 이용하여 에너지 갭을 측정하였다. 박막의 표면 상태는 atomic force microscopy (AFM) 사진과 주사 전자 현미경 (SEM) 사진으로 관찰하여 결정구조와 성장 용도와의 연관성을 조사하였다. 광학 상수는 Spectroscopic ellipsometry (SE) 방법을 이용하여 박막의 광학 상수를 측정했다. PbSnSe 화합물 에피층 시료의 굴절률(n), 유전상수(${\varepsilon}$), 반사율(R) 그리고 흡수 계수(${\alpha}$)등 광학상수를 측정하였다.