참고문헌
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X-ray photoelectron spectroscopy (XPS) of hydrogenated amorphous silicon carbide (a-
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Phys. Rev.
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Raman scattering and hydrogen-content analysis of amorphous hydrogenated carbon films irradiated with 200-KeV
$C^+$ ions L.A.Farrow;B.J.Wilkens;A.S.Gozdz;D.L.Hart - Phys. Rev. v.B29 Use of Raman scattering to investigate disorder and crystallite formation in as-deposited and annealed carbon films R.O.Dillon;J.A.Woollam;V.Katkanant
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