대한전자공학회논문지SD (Journal of the Institute of Electronics Engineers of Korea SD)

대한전자공학회 (The Institute of Electronics and Information Engineers)
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테스팅 및 저전력을 고려한 최적화된 상태할당 기술 개발

Development of Optimized State Assignment Technique for Testing and Low Power

  • 조상욱 (한양대학교 컴퓨터공학과) ;
  • 이현빈 (한양대학교 컴퓨터공학과) ;
  • 박성주 (한양대학교전자 컴퓨터공학과)
  • Cho Sangwook (Dept. of Computer Science & Engineering, Hanyang University) ;
  • Yi Hyunbean (Dept. of Computer Science & Engineering, Hanyang University) ;
  • Park Sungju (Dept. of Electrical Engineering Computer Science, Hanyang University)
  • 발행 : 2004.01.01
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⟨ 이전 논문 다음 논문 ⟩

초록

유한상태기의 상태할당은 이로부터 구현되는 순차회로의 속도, 면적, 테스팅 및 소비전력에 큰 영향을 미친다. 본 논문에서는 상태변수 그룹들 사이에 상호 의존성(dependency)을 최소화하여 테스팅 및 전력소모를 개선하기 위한 m-블록 분할을 이용한 새로운 상태할당 기술을 소개한다. m-블록 분할 알고리즘에 의해 상태도로부터 상태들을 그룹으로 나누어 상태변수의 상호의존성을 줄이고, 상태천이 확률에 의해 결정된 무게인자에 따라 상태간 상태변수의 변화를 최소로하는 코드를 할당하여 상태천이시 스위칭 횟수를 줄인다. 상태변수 의존성을 줄임으로써 순차회로 사이클이 줄어들어서 부분스캔 및 테스트 생성이 용이하게 되고, 상태변수간의 스위칭 횟수를 줄임으로써 소비전력이 줄어들게 든다. 즉, 본 상태할당 기술은 서로 상반 관계에 있는 테스팅과 저전력 문제를 동시에 해결할 수 있는 새로운 기술이다. 벤치마크 회로에 대한 실험결과 기존의 방법보다 고장점검도 및 소비전력이 현저히 개선되었음을 확인하였다.

The state assignment for a finite state machine greatly affects the delay, area, power dissipation, and testabilities of the sequential circuits. In order to improve the testabilities and power consumption, a new state assignment technique . based on m-block partition is introduced in this paper. By the m-block partition algorithm, the dependencies among groups of state variables are minimized and switching activity is further reduced by assigning the codes of the states in the same group considering the state transition probability among the states. In the sequel the length and number of feedback cycles are reduced with minimal switching activity on state variables. It is inherently contradictory problem to optimize the testability and power consumption simultaneously, however our new state assignment technique is able to achieve high fault coverage with less number of scan nfp flops by reducing the number of feedback cycles while the power consumption is kept low upon the low switching activities among state variables. Experiment shows drastic improvement in testabilities and power dissipation for benchmark circuits.

키워드

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