Journal of the Institute of Electronics Engineers of Korea SD (대한전자공학회논문지SD)

The Institute of Electronics and Information Engineers (대한전자공학회)
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Mixed-Signal Circuit Testing Using Digital Input and Frequency Analysis

디지털입력과 주파수 성분 분석을 통한 혼성신호 회로 테스트 방법

  • 노정진 (한양대학교 전자컴퓨터공학부)
  • Published : 2003.04.01
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Abstract

A new technique for detecting parametric faults in mixed signal circuits is proposed Pseudo-random sequence from linear feedback shift register(LFSR) is fed to circuit-under-test (CUT) as stimulus and wavelets are used to compact the transient response under this stimulus into a small number of signature. Wavelet based scheme decomposes the transient response into a number of signal in different frequency bands. Each decomposed signal is compacted into a signature using digital integrator. The digital pulses from LFSR, owing to its pseudo-randomness property, are almost uniform in frequency domain, which generates multi-frequency response when passed through CUT. The effectiveness of this technique is demonstrated in our experimental results.

혼성신호 회로에 발생할 수 있는 각종 파라메트릭 폴트를 검사하기 위한 새로운 기법을 제안한다. LFSR에서 발생하는 랜덤신호를 사용하여 테스트 입력으로 사용하며, 웨이블릿으로 테스트 출력을 분석하고 압축하는 방법을 사용한다. 웨이블릿은 테스트 출력을 다른 여러 주파수 대역으로 분석하여 각각에 대한 응답 신호를 발생시킨다. 각각의 신호는 디지털 적분기를 사용하여 압축된다. LFSR에서 발생된 테스트 입력신호는 전체 주파수 영역에서 일정한 값을 유지하게 되며 따라서 multi-frequency 응답을 발생시켜 준다. 제안된 방법은 실험을 통하여 성능을 검증하였다.

Keywords

References

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