Journal of Institute of Control, Robotics and Systems (제어로봇시스템학회논문지)

Institute of Control, Robotics and Systems (제어로봇시스템학회)
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A Study on the Improvement of Autofocusing Using Image Resampling Method

영상 재표본화에 의한 Autofocusing 속도 향상에 관한 연구

  • Published : 2003.01.01
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Abstract

A faster autofocusing method is proposed. The searching speed of microscope camera is limited by the long focusing time due to too much sampled digital image data. The improvement of autofocusing speed based on the down sampling is discussed analytically and is proved by experiments. The anticipated aliasing is found negligible in shilling rate of focus measure.

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References

  1. S. K. Nayar and Y. Nakagawa, 'Shape from focus,' IEEE Trans. Pattern Analysis and Machine Intelligence, Vol. 16, pp. 824-831, Aug. 1994 https://doi.org/10.1109/34.308479
  2. M. Y. Yang and O. D. Kwon, 'Crater wear measurement using computer vision and automatic focusing,' J. of Materials Processing Tech., 58, pp. 362-367, 1996 https://doi.org/10.1016/0924-0136(95)02208-2
  3. M. Subbarao and J. K. Tyan, 'Selecting the optimal focus measure for autofocusing and depth from focus,' IEEE Trans. Pattern Analysis and Machine Intelligence, Vol. 20, pp. 864-870, Aug. 1998 https://doi.org/10.1109/34.709612
  4. K. S. Choi, J. S. Lee and S. J. Ko, 'New autofocusing technique using the frequency selective weighted median filter for video cameras' IEEE Trans. Consumer Electronics, Vol. 45, No. 3, pp. 820-827, Aug. 1999 https://doi.org/10.1109/30.793616
  5. J. Widjaja and S. Jutamulia, 'Use of wavelet analysis for improving autofocusing capability' Optics Communications, 151, pp. 12-14, 1998 https://doi.org/10.1016/S0030-4018(98)00119-9
  6. S. C. Chapara and R. P. Canale, Numerical Method for Engineers, McGrawHill 3rd edition, 1988
  7. R. C. Gonzalez and R. E. Woods, Digital Image Processing, Addison Wesley Longman, 1992
  8. X. Roca, X. Binefa and J. Vitria, 'New autofocusing algorithm for cytological tissue in a microscopy environment,' Optical Engineering, Vol. 37, No. 2, pp. 635-641, Feb. 1998 https://doi.org/10.1117/1.601864