References
- Single- and Multi-Carrier Quadrature Amplitude Modulation Hanzo, L.;Webb, W.;Keller, T.
- Int’l Journal of Wireless Information Networks v.1 no.2 On the Bit Error Probability of QAM Modulation Fitz, M.P.;Seymour, J.P.
- IEEE Comm. Lett. v.4 no.10 A Recursive Algorithm for the Error Probability Evaluation of M-QAM Yang, L.;Hanzo, L.
- IEEE Trans. Commun. v.50 On the General BER Expression of One and Two Dimensional Amplitude Modulations Cho, K.;Yoon, D.
- Conference version in Proc. IEEE VTC Fall2000 v.5 Cho, K.;Yoon, D.
- The m-distribution - A general Formula of Intensity Distribution of Rapid Fading;Statistical Methods in Radio Wave Propagation Nakagami, M.;Hoffman, W.G.(ed.)
- Tables of Integral, Series and Product Gradshteyn, I.S.;Ryzhik, I.M.
- Mobile Communication Engineering Jakes, W.C.
- Electron. Lett. v.32 no.17 Average Error Rate for Coherent MPSK Signals in Nakagami Fading Channels Aalo, V.;Pattaramalai, S.
- IEEE Trans. Commun. v.49 Error Rates for Nakagami-m Fading Multichannel Reception of Binary and M-ary Signals Annamalai, A.
- IEEE Trans. Commun. v.43 Performance of Maximal-Ratio Diversity Systems in a Correlated Nakagami-Fading Environment Aalo, V.
- IEEE Trans. Commun. v.33 Performance of MRC Diversity Systems for the Detection of Signals with Nakagami Fading Al-Hussaini, E.K.;Al-Bassiouni, A.A.M.
- IEEE Trans. Commun. v.43 Coherent DS-CDMA Performance in Nakagami Multipath Fading Eng, T.;Milstein, B.
- Multiple Hypergeometric Functions and Applications Exton, H.
- Electron. Lett. v.38 no.3 General Bit Error Probability of Rectangular Quadrature Amplitude Modulation Yoon, D.;Cho, K.
-
ETRI J.
v.21
no.2
A Study on
${\pi}/4 $ DQPSK with Nonredundant Multiple Error Correction Song, S.;Han, Y. - ETRI J. v.22 no.4 Adaptive Compensation Method Using the Prediction algorithm for the Doppler Frequency Shift in the LEO Mobile Satellite Communication System You, M.H.;Lee, S.P.;Han, Y.
- ETRI J. v.17 no.4 SER Analysis of QAM with Space Diversity in Rayleigh Fading Channels Kim, C.J.;Kim, Y.S.;Jeong, G.Y.;Mun, J.K.;Lee, H.J.