대한전자공학회논문지SD (Journal of the Institute of Electronics Engineers of Korea SD)

대한전자공학회 (The Institute of Electronics and Information Engineers)
권호 표지

혼성 신호 회로에 대한 효과적인 BIST

An Efficient BIST for Mixed Signal Circuits

  • 방금환 (연세대학교 전자공학과) ;
  • 강성호 (연세대학교 전자공학과)
  • Bang, Geum-Hwan (Dept. of Electronic Engineering Yonsel University. seoul) ;
  • Gang, Seong-Ho (Dept. of Electronic Engineering Yonsel University. seoul)
  • 발행 : 2002.08.01
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초록

혼성 신호 회로의 설계에 있어 저비용의 고효율 테스트 효율을 보장하기 위해 테스트의 노력은 계속되어 왔다. 특히 테스트를 고려한 BIST(built-in-self-test)설계 방법으로 발전해가고 있는 추세인데, 회로상에서 전체적인 테스트 용이도와 분석에 있어 보다 향상된 방법으로 접근할 수 있고 이러한 시스템에 대해 분석하는데 수월하게 할 수도 있다. 이 논문에서는 효과적인 테스트를 위한 방법을 위해 DC전압과 전압 위상에 대한 BIST를 구현하는 것을 제안하였다. 즉 정상적인 회로와 고장회로에서의 동작에서 전압과 위상의 차이를 검출하는 회로를 하드웨어상으로 구성함으로써 비용과 시간 등을 효과적으로 줄이는 방법을 제안하였다. 실험 결과에서는 기존의 BIST와 비교하여 향상된 것을 나타낸다.

For mixed signal circuits that integrate both analog and digital blocks onto the same chip, testing the mixed circuits has become the bottleneck. Since most of mixed signal circuits are functionally tested, mixed signal testing needs expensive automatic test equipments for test input generation and response acquisition. In this paper, a new efficient BIST is developed which can be used for mixed signal circuits. In the new BIST, only faults on embedded resistances, capacitances and its combinations are considered. To guarantee the quality of chips, the new BIST performs both voltage testing and phase testing. Using these two testing modes, all the faults are detected. In order to support this technique, the voltage detector and the phase detector are developed. Experimental results prove the efficiency of the new BIST.

키워드

참고문헌

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