Development of Reliability Analysis System(RAS) with Field Failure Data of Continuously Shipping Products

연속출하제품의 사용현장 데이터를 이용한 신뢰도 분석 시스템 (RAS) 개발

  • Kwon, Soo-Ho (Reliability Team, Quality & Reliability Center, LG Electronics, Inc.) ;
  • Yu, Hyun (Reliability Team, Quality & Reliability Center, LG Electronics, Inc.) ;
  • Lim, Tae-Jin (Dept. of Industrial & Information Systems Engineering, Soongsil University)
  • 권수호 (LG전자 품질센터 신뢰성추진팀) ;
  • 유현 (LG전자 품질센터 신뢰성추진팀) ;
  • 임태진 (숭실대학교 산업.정보시스템공학과)
  • Published : 1999.12.01

Abstract

This paper concerns Reliability Analysis System(RAS) developed by LG Electronics, Inc. for collecting, classifying, and analyzing field failure data. To develop this system, a database for the management of field failure data was built and several functions were included to analyze and assess the product reliability. Nonparametric estimation and cumulative hazard plotting techniques were applied to estimate the reliability for a specific period. This system serves not only engineers in charge of quality but also designers who wish to monitor the reliability of their own products.

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