참고문헌
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- In Reliability and Bilmetry Reliability Analysis of Complex Crow, L. H.;F. Proschan;R. J. Serfling(eds.)
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- IEEE Transactions on Aerospace v.2 Learning Curve Approach to Reliability Duane, J. T.
- IEEE Transactions on Reliability v.35 On the MTBF for Repairable Systems Engelhardt, M.;Bain, L. J.
- Technometrics v.20 Some Results on Inference for the Weibull Process Lee, L;Lee, S. K.
- Scandinavian Journal of Statistics v.3 The Rasch-Weibull Process Moller, S. K.