전자공학회논문지A (Journal of the Korean Institute of Telematics and Electronics A)
- 제33A권2호
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- Pages.184-195
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- 1996
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- 1016-135X(pISSN)
전류 경로 그래프를 이용한 BiCMOS회로의 단락고장 검출
On the detection of short faults in BiCMOS circuits using current path graph
초록
Beause BiCMOS logic circuits consist of CMOS part which constructs logic function and bipolar part which drives output load, the effect of short faults on BiCMOS logic circuits represented different types from that on CMOS. This paper proposes new test method which detects short faults on BiCMOS logic circuits using current path graph. Proposed method transforms BiCMOS circuits into raph constructed by nodes and edges using extended switch-level model and separates the transformed graph into pull-up part and pull-down part. Also, proposed method eliminates edge or add new edge, according ot short faults on terminals of transistor, and can detect short faults using current path graph that generated from on- or off-relations of transistor by input patterns. Properness of proposed method is verified by comparing it with results of spice simulation.
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