Applied Microscopy
- 제25권3호
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- Pages.99-107
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- 1995
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- 2287-5123(pISSN)
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- 2287-4445(eISSN)
수렴성빔 전자회절법을 이용한 리오캐스팅시킨 과공정 Al-Si합금에서 실리콘초정의 격자상수 측정
Measurement of Lattice Parameter of Primary Si crystal in Rheocast Hypereutectic Al-Si Alloy by Convergent Beam Electron Diffraction Technique
- Lee, Jung-Ill (Division of Metals, Korea Institute of Science and Technology) ;
- Kim, Gyeung-Ho (Division of Metals, Korea Institute of Science and Technology) ;
- Lee, Ho-In (Division of Metals, Korea Institute of Science and Technology)
- 발행 : 1995.09.01
초록
The morphological changes of primary solid particles as a function of process time on hypereutectic Al-15.5wt%Si alloy during semi-solid state processing with a shear rate of
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