Journal of the Korean Institute of Telematics and Electronics A (전자공학회논문지A)
- Volume 31A Issue 12
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- Pages.106-114
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- 1994
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- 1016-135X(pISSN)
A Study on the New Isolation Technology to Improve the Bird's Beak and the Device Characteristics
Bird's Beak 및 소자특성 개선을 위한 새로운 Isolation 기술에 대한 연구
Abstract
The local oxidation of silicon (LOCOS) technology, which uses a silicon nitride film as an oxidation mask and a pad oxide beween the silicon nitride and the silicon substrate, has been widely used in integrated circuits for process simplicity. But, due to long brid's beak length, there are difficulties in scabilities. Many advanced isolation techniques have been wuggested for the feduction of bird's beak length. In this paper, we presented reduced bird's beak length using the polybuffered oxide and the silicon nitride as the sidewall. Also, investigating the electrical behavior of the parasitic Al-gate MOSFET on LOCOS, we proved the validity for new isolation process.
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