Syndrome Testable Design for Large MOSPLA's

신드롬 테스트가 용이한 대규모 MOSPLA의 설계

This paper proposes a new syndrome-testable design method for large MOSPLA's. In the conventional syndrome test method, the testing array circuit for testability is added but it has the defect that the circuit gives effect on the normal operation of the basic PLA circuit. Therefore, by adding the shift registers to the product lines of the basic MOSPLA's this defect is eliminated and the number of test patterns is decreased. In order to reduce the number of fault free syndromes to be predetermined, also, one output line, which is connected to all product lines is added. Therefore the number of output lines be observed is decreased. And the analytical method to compute fault free syndromes is presented. By unsing this method, the time and the effort to compute the syndromes are decreased.