EDISON SW 활용 경진대회 논문집 (Proceeding of EDISON Challenge)
- 제5회(2016년)
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- Pages.277-279
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- 2016
Optimum Channel Thickness of Nanowire-FET
- Go, Hyeong-U (Inter-University Semiconductor Research Center (ISRC) and School of Electrical Engineering and Computer Science, Seoul National University) ;
- Kim, Jong-Su (Inter-University Semiconductor Research Center (ISRC) and School of Electrical Engineering and Computer Science, Seoul National University) ;
- Kim, Sin-Geun (Inter-University Semiconductor Research Center (ISRC) and School of Electrical Engineering and Computer Science, Seoul National University) ;
- Sin, Hyeong-Cheol (Inter-University Semiconductor Research Center (ISRC) and School of Electrical Engineering and Computer Science, Seoul National University)
- 발행 : 2016.03.22