대한전자공학회:학술대회논문집 (Proceedings of the IEEK Conference)
- 대한전자공학회 2008년도 하계종합학술대회
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- Pages.901-902
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- 2008
픽셀 명암도를 이용한 물체 깊이 측정
Depth Measurement Using Pixel Intensities
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Choi, Wook-Jin
(Gwangju Institute of Science and Technology)
;
- Mannan, S.M. (Gwangju Institute of Science and Technology) ;
- Lee, Min-Ji (Gwangju Institute of Science and Technology) ;
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Choi, Tae-Sun
(Gwangju Institute of Science and Technology)
- 발행 : 2008.06.18
초록
In this paper, we have proposed a new method to estimate three dimensional (3D) shape of an object. The new method is simple and fast, based on Pixel-Intensities in the images sequence as a model for depth measurement. The images are taken by varying the focus value in small steps, and each pixel in the image is taken as a single measurement. The proposed algorithm is more fast and accurate than previous methods.
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