Proceedings of the IEEK Conference (대한전자공학회:학술대회논문집)
- 2008.06a
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- Pages.901-902
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- 2008
Depth Measurement Using Pixel Intensities
픽셀 명암도를 이용한 물체 깊이 측정
- Choi, Wook-Jin (Gwangju Institute of Science and Technology) ;
- Mannan, S.M. (Gwangju Institute of Science and Technology) ;
- Lee, Min-Ji (Gwangju Institute of Science and Technology) ;
- Choi, Tae-Sun (Gwangju Institute of Science and Technology)
- Published : 2008.06.18
Abstract
In this paper, we have proposed a new method to estimate three dimensional (3D) shape of an object. The new method is simple and fast, based on Pixel-Intensities in the images sequence as a model for depth measurement. The images are taken by varying the focus value in small steps, and each pixel in the image is taken as a single measurement. The proposed algorithm is more fast and accurate than previous methods.
Keywords