Proceedings of the KSME Conference (대한기계학회:학술대회논문집)

The Korean Society of Mechanical Engineers (대한기계학회)
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Accelerated Life Test for 1.25Gbps Transceiver

광통신용 1.25Gbps Transceiver 가속수명시험

  • 윤광수 (한국전자통신연구원 광통신연구센터) ;
  • 유정희 (한국전자통신연구원 광통신연구센터) ;
  • 허영순 (한국전자통신연구원 광통신연구센터)
  • Published : 2008.11.05
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Abstract

In this paper, the long-term reliability for 1.25G transceiver in use of high speed optical access network is investigated. High temperature storage tests and accelerated life tests are used to long-term reliability. Accelerated aging test have been during 3,000 hour of the three accelerated aging conditions by caused high temperature stress. Mean life is assumed to follow the Arrhenius relationship and analysis from the failure data obtained in the accelerated aging conditions.

Keywords