• Title/Summary/Keyword: 가속수명시험

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가속수명시험과 사례

  • Kim, Jae-Jung
    • Journal of the KSME
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    • v.49 no.12
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    • pp.60-64
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    • 2009
  • 이 글에서는 신속한 신뢰성 정보를 얻고자 시험기간을 단축하기 위한 목적으로 실시하는 가속시험인 가속수명시험과 가속열화시험의 정의, 설계 및 시험방법에 대하여 기술하였으며, 사례로서 슬라이드형 휴대폰에 적용되는 FPCB에 대한 가속수명시험법을 소개하였다.

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열전모듈의 가속수명시험과 고장분석을 통한 신뢰도 예측

  • 최형석;이태원;이영호;이명현;서원선
    • Proceedings of the Korean Reliability Society Conference
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    • 2004.07a
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    • pp.123-128
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    • 2004
  • 본 논문에서는 가속 수명 시험을 통하여 열전소자의 수명 분포, 모수 등을 규명하였으며 고장 분석을 통하여 열전 소자의 수명 증가를 위한 대책 방안을 논의하였다. 가속 수명 시험 결과 열전 소자는 형상 모수 3,6인 Weibull 분포를 따름을 알 수 있었다. 열전 소자가 반도체 부품임에도 불구하고 형상 모수가 큰 이유는 반복 Bending에 의한 피로 파괴가 발생하기 때문임을 고장 분석을 통하여 규명하였다. 위의 고장 메커니즘을 설명할 수 있는 가속 모델식은 Coffin-Manson식으로 설명되어 질 수 있으며 가속수명시험 결과 재료 상수는 1.8임을 알 수 있었다.

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회로팩의 온도가속 수명시험에 관한 고찰

  • Kim, Chang-Hui;Yang, Chung-Ryeol;Go, Jae-Sang
    • Electronics and Telecommunications Trends
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    • v.7 no.3
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    • pp.145-153
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    • 1992
  • 통신시스팀을 구성하는 PBA수준에 대해 운용중의 고장률 추정 및 고장형태 파악을 목적으로 실시하는 가속수명시험에 대해 서술하였다. 이를 위해 통신 시스팀에서 나타나는 고장 유형 및 각 기간에서의 고장률데이터 확보방법, 가속수명시험의 종류 및 원리, 시스팀을 구성하는 PBA 수준에 대한 가속수명시험조건에 대해 서술하였다.

Accelerated Life Testing and Validity Evaluation of Finger Strips Used for Electromagnetic Shielding Doors (전자파 차폐 도어용 핑거 스트립의 가속수명시험 및 유효성 평가)

  • Lee, Joo Hong;Kim, Do Sik;Chang, Mu Seong;Cho, Hae Yong
    • Transactions of the Korean Society of Mechanical Engineers A
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    • v.39 no.9
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    • pp.831-837
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    • 2015
  • Many persons and electronic devices are exposed to electromagnetic (EM) waves generated from magnetic resonance imaging (MRI) equipment, EM pulses (EMPs), and many other kinds of EM wave devices. Finger strips are used to provide shielding from these EM waves. Because of the high thermal conductivity of finger strips, they are used in the design of specialized doors that are installed in shielded rooms. In this study, we perform an accelerated life test using the load acceleration stress, which affects the main failure mode of finger strips. We predict the life of the finger strip under normal usage conditions based on the results of the accelerated life test. We compare the results with those predicted from the life test under normal usage conditions to evaluate the validity of accelerated life testing.

Study on Acceleration Factor Model with Accelerated Stress Interactions (가속 스트레스의 교호작용을 고려한 가속계수 모델에 대한 연구)

  • Kim, Hyoung-Eui;Kang, Bo-Sik;Cho, You-Hee
    • Transactions of the Korean Society of Mechanical Engineers A
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    • v.36 no.7
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    • pp.751-757
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    • 2012
  • An accelerated life test (ALT) is a test method that forces components to fail more quickly than they would under use conditions by applying higher overstresses. When two or more accelerating stresses are involved in an ALT, an interaction effect may occur. In previous studies, mostly ALTs without considering an interaction of accelerated stresses and accelerated life models were proposed. The life data obtained are extrapolated using a life-stress relationship to estimate the life distribution at use conditions. We use the general log-linear relationship to model the dependence of life in the Weibull distribution on stress. Therefore, this study suggests the acceleration factor model between the lives at use conditions and accelerated conditions by using mechanical component life data considering an interaction effect. Further, the accelerated life test method and acceleration factor model proposed in this paper will be the basis for adopting an accelerated life test with accelerated stress interactions.

Lifetime Estimation of a Bluetooth Module using Accelerated Life Testing (가속수명시험을 이용한 블루투스 모듈의 수명 예측)

  • Son, Young-Kap;Chang, Seog-Weon;Kim, Jae-Jung
    • Journal of the Microelectronics and Packaging Society
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    • v.15 no.2
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    • pp.55-61
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    • 2008
  • This paper shows quantitative reliability evaluations of a Bluetooth module through extending previous qualitative methods limited to structure reliability tests and solder joint reliability tests for Bluetooth modules. Accelerated Life Testing (ALT) of the modules using temperature difference in temperature cycling as an accelerated stress was conducted for quantitative reliability evaluation under field environment conditions. Lifetime distribution parameters were estimated using the failure times obtained through the ALT, and then Coffin-Manson model was implemented. Results of the ALT showed that the failure mode of the modules was open and the failure mechanisms are both crack and delamination. The ALT reproduced the failure mode and mechanisms of failed Bluetooth modules collected from the field. Further, a quantitative reliability evaluation method with respect to various temperature differences in temperature cycling was proposed in this paper. $B_{10}$ lifetime of the module for the temperature difference $70^{\circ}C$ using the proposed method would be estimated as about 4 years.

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An Estimation of Cumulative Exposure Model based on Kullback-Leibler Information Function (쿨백-라이블러 정보함수를 이용한 누적노출모형 추정)

  • 안정향;윤상철
    • Journal of the Korea Industrial Information Systems Research
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    • v.9 no.2
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    • pp.1-8
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    • 2004
  • In this paper, we propose three estimators of Kullback-Leibler Information functions using the data from accelerated life tests. This acceleration model is assumed to be a cumulative exposure model. Some asymptotic properties of proposed estimators are proved. Simulations are performed for comparing the small sample properties of the proposed estimators under use condition of accelerated life test.

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A comparison of opimum constant stress and step stress accelerated life tests (일정형 가속수명시험과 계단형 가속수명시험의 비교 : 최적설계를 중심으로)

  • 배도선;김명수;전영록
    • The Korean Journal of Applied Statistics
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    • v.9 no.1
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    • pp.53-73
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    • 1996
  • This paper compares two accelerated life for Weibull distribution. One is the optimum constant stress accelerated life test which minimizes the asymptotic variance of maximum likelihood estimator of a specified quantile at design stress, and the other is corresponding simple step stress test. The models and optimum designs of constant stress and step stress tests are reviewed. Behaviors of asymptotic variances, effects of design parameters to optimum tests, and expected numbers of failures and expected test times of the two tests are investigated. The efficiency of step stress test relative to constant stress test is studied in terms of variance ratio, and robustness to preestimates of design parameters are investigated.

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Accelerated Lifetime Data Analysis Using Quantile Regression (분위수 회귀를 이용한 가속수명시험 자료 분석)

  • Roh, Chee-Youn;Kim, Hee-Jeong;Na, Myung-Hwan
    • The Korean Journal of Applied Statistics
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    • v.21 no.4
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    • pp.631-638
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    • 2008
  • Accelerated Lifetime Test is a method of estimation of lifetime quality characteristics under operation condition with the accelerated lifetime data obtained under accelerated stress. In this paper we propose estimation method with accelerated lifetime data using quantile regression. We apply the method to real data with Arrhenius and Inverse power model.

An Estimation of Kullback-Leibler Information Function based on Step Stress Accelerated Life Test (단계 스트레스 가속수명모형을 이용한 쿨백-라이블러 정보함수에 대한 추정)

  • 박병구;윤상철;조건호
    • The Korean Journal of Applied Statistics
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    • v.13 no.2
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    • pp.563-573
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    • 2000
  • In this paper, we propose three estimators of Kullback-Leibler Information functions using the data from accelerated life tesb. This acceleration model is assumed to be a tampered random variable model. Some asymptotic properties of proposed estimators are proved. Simulations are performed for comparing the small sample properties of the proposed estimators under use condition of accelerated life test.

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