Tracking Algorithm about Location of One-Hot Signal in Embedded System

Embedded System One-Hot 시그널의 위치 추적 알고리즘

  • Jeon, Yu-Sung (School of Information&Communication Engineering, Sungkyunkwan University) ;
  • Kim, In-Soo (School of Information&Communication Engineering, Sungkyunkwan University) ;
  • Min, Hyoung-Bok (School of Information&Communication Engineering, Sungkyunkwan University)
  • 전유성 (성균관대학교 정보통신공학부) ;
  • 김인수 (성균관대학교 정보통신공학부) ;
  • 민형복 (성균관대학교 정보통신공학부)
  • Published : 2008.07.16

Abstract

The Logic Built In Self Test (LBIST) technique is substantially applied in chip design in most many semiconductor company in despite of unavoidable overhead like an increase in dimension and time delay occurred as it used. Currently common LBIST software uses the MISR (Multiple Input Shift Register) However, it has many considerations like defining the X-value (Unknown Value), length and number of Scan Chain, Scan Chain and so on for analysis of result occurred in the process. So, to solve these problems, common LBIST software provides the solution method automated. Nevertheless, these problems haven't been solved automatically by Tri-state Bus in logic circuit yet. This paper studies the simulator and algorithm that judges whether Tri-state Bus lines is the circuit which have X-value or One-hot Value after presuming the control signal of the lines which output X-value in the logic circuit to solve the most serious problems.

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