대한전기학회:학술대회논문집 (Proceedings of the KIEE Conference)

대한전기학회 (The Korean Institute of Electrical Engineers)
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CMOS 구조를 이용한 DAC의 자체 테스트 기법에 관한 연구

Built-In Self-Test of DAC using CMOS Structure

  • 조성찬 (성균관대학교 정보통신공학부) ;
  • 김인수 (성균관대학교 정보통신공학부) ;
  • 민형복 (성균관대학교 정보통신공학부)
  • Cho, Sung-Chan (Depart. of Information & Communication Engineering, Sungkyunkwan University) ;
  • Kim, In-Soo (Depart. of Information & Communication Engineering, Sungkyunkwan University) ;
  • Min, Hyoung-Bok (Depart. of Information & Communication Engineering, Sungkyunkwan University)
  • 발행 : 2007.07.18
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초록

Testing the analog/mixed-signal circuitry of a mixed-signal IC has become a difficult task. Offset error, gain error, Non-monotonic behavior, Differential Non-linearity(DNL) error, Integral Non-linearity(INL) error are important specifications used as test parameters for DAC. In this paper, we propose an efficient BIST structure for DAC testing. The proposed BIST adds the circuit which uses the capacitor and op-amp, and accomplishes a test.

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