대한전기학회:학술대회논문집 (Proceedings of the KIEE Conference)
- 대한전기학회 2007년도 제38회 하계학술대회
- /
- Pages.927-928
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- 2007
내부고장으로 인한 아크상태의 저압배전반 시험방법 동향 고찰
Study on Testing Enclosed low-voltage switchgear and controlgear assemblies Under conditions of arcing due to internal faults
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Kim, Sun-Ho
(KERI) ;
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Kim, Sun-Koo
(KERI) ;
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Roh, Chang-Il
(KERI) ;
-
Jung, Heung-Soo
(KERI) ;
- Kim, Won-Man (KERI) ;
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Lee, Dong-Jun
(KERI)
- 발행 : 2007.07.18
초록
Recently IEC has made considerations on testing Enclosed low-voltage switchgear and controlgear assemblies under conditions of arcing due to internal faults. This paper will make a study on testing Enclosed low-voltage switchgear and controlgear assemblies under conditions of arcing due to internal faults that is suggested by IEC.
키워드