전자부품의 새로운 절연평가기법 연구

A Study on the New Evaluation Method on Insulation of Electronic Components

  • 길경석 (한국해양대학교 전기전자공학부) ;
  • 송재용 (한국해양대학교 전기전자공학부) ;
  • 문승보 (한국해양대학교 전기전자공학부) ;
  • 차명수 (한국해양대학교 전기전자공학부)
  • 발행 : 2006.06.22

초록

This paper describes a low-level partial discharge(PD) testing that has been accepted as a non-destructive test method on insulation performance of electronic components. A comparative PD analysis combined with the Withstand Voltage Test (WVT) specified in IEC standards is carried out on high frequency switching transformers. The analysis shows that insulation degradation of the transformers under test progresses during the WVT. To avoid insulation degradation of the specimen, PD test has to be carried out at as low voltage as possible. In this study, the PD test on the transformers is performed in ranges from 50% to 70% of the test voltage specified in the WVT by measuring apparent charges below 1 pC. From the experimental results, it is expects that the low-level PD test is applicable for electronic components as a replacement of the WVT.

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