Reliablity of Distributed Feedback Laser Diodes for High-speed Optical Communication Systems

고속 광통신 시스템용 비대칭 분포귀환형 레이져 다이오드의 신뢰성에 관한 연구

As the demand of internet networks using backbone communication systems recently increased, the researches on the high-speed wideband optical communication systems are required. For high-speed optical communication systems, asymmetric sampled grating distributed feedback laser diodes (DFB-LDs) are developed and the reliability of DFB-LDs is examined. The reliability of DFB-LDs is performed by monitoring I-V and L-I characteristics and two degradation phenomena related to the electrical characteristics of LDs are observed during the life tests. The first degradation phenomenon by increasing the reverse current is considered as a formation of leakage current path enough to prevent lasing operation in lateral blocking layer near active region of lasers. The second degradation phenomenon by decreasing the forward current is considered as activation of non-radiative Auger recombination process by thermal energy and the second degradation phenomenon is recovered after the off-test period at room temperature Eventually, evaluating the reliability of DFB LDs can allow us to improved the manufacturability in high-volume manufacturing.