Proceedings of the Korean Reliability Society Conference (한국신뢰성학회:학술대회논문집)
- 2005.06a
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- Pages.339-348
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- 2005
Effect of Water Temperature on Generation of Ion Migration
이온 마이그레이션 발생에 대한 수분온도의 영향
- Lee Deok Bo (Reliability Technology Management Research Center, Korean Standards Association) ;
- Kim Jung Hyun (Reliability Analysis Research Center, Hanyang University) ;
- Kang Soo Keun (Reliability Analysis Research Center, Hanyang University) ;
- Kim Sang Do (Reliability Analysis Research Center, Hanyang University) ;
- Jang Seok Won (Reliability Analysis Research Center, Hanyang University) ;
- Lim Jae Hoon (Ref. CS Group, Global CS Team, System Appliances Division, Digital Appliance Business, Samsung Electronics Co. LTD) ;
- Ryu Dong Soo (Ref. CS Group, Global CS Team, System Appliances Division, Digital Appliance Business, Samsung Electronics Co. LTD)
- 이덕보 (한국표준협회 신뢰성기술경영연구원) ;
- 김정현 (한양대학교 신뢰성분석연구센터) ;
- 강수근 (한양대학교 신뢰성분석연구센터) ;
- 김상도 (한양대학교 신뢰성분석연구센터) ;
- 장석원 (한양대학교 신뢰성분석연구센터) ;
- 임재훈 (삼성전자 생활가전 총괄시스템 가전사업부 Global CS팀 냉장고 CS그룹) ;
- 유동수 (삼성전자 생활가전 총괄시스템 가전사업부 Global CS팀 냉장고 CS그룹)
- Published : 2005.06.01
Abstract
In evaluation of electronic reliability on the PCB(Printed Circuit Board),electrochemical migration is one of main test objects. The phenomenon of electrochemical migration occurs In the environment of the high humidity and the high temperature under bias through a continuous aqueous electrolyte. In this paper, the generating mechanism of electrochemical migration is investigated by using water drop acceleration test under various waters. The waters used in the water drop test are city water, distilled water and ionic water. It found that the generated velocity o of electrochemical migration depended on the temperature of water and the electrolyte quantity which included in the various waters.
Keywords