Proceedings of the Korean Reliability Society Conference (한국신뢰성학회:학술대회논문집)

The Korean Reliability Society (한국신뢰성학회)
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Accelerated Life Test for Door Switch

도어스위치의 가속수명시험

  • Kim Sang Uk (Failure Analysis LAB, GCS Administration Group Global CS Team, System Appliance Division, Samsung Electronics) ;
  • Jang Young Kee (Failure Analysis LAB, GCS Administration Group Global CS Team, System Appliance Division, Samsung Electronics) ;
  • Moon Chul Hui (Failure Analysis LAB, GCS Administration Group Global CS Team, System Appliance Division, Samsung Electronics)
  • 김상욱 (삼성전자, 시스템가전사업부) ;
  • 장영기 (삼성전자, 시스템가전사업부) ;
  • 문철희 (삼성전자, 시스템가전사업부)
  • Published : 2005.06.01
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Abstract

Accelerated life test models and procedure are developed to assess the reliability of Door switch. The main function of door switch is to operate bulb lamp and fan motor. The accelerated life test method and test equipments are developed using the relationship between stresses and life characteristics of the products. Using the developed accelerated life test method, the parameters of the ALT model and life time distribution are estimated and the reliability of the Door S/W at use condition if assessed. The proposed accelerated life test method and procedure may be extended and applied to testing similar kinds of products to reduce test time and costs of the tests remarkably.

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