Proceedings of the Korean Vacuum Society Conference (한국진공학회:학술대회논문집)
- 2004.08a
- /
- Pages.165-165
- /
- 2004
Correlation of MS interface states to the Schottky barrier height and manufacture of the Metal-Silicon Schottky junction diode
- Jun, Sung-Ho (Dept. of Nano Science and Technology, University of Seoul) ;
- Ham, Chul-Young (Dept. of Nano Science and Technology, University of Seoul) ;
- Han, Hee-Soo (Dept. of Nano Science and Technology, University of Seoul) ;
- Ko, Chang-Hun (Dept. of Physics, University of Seoul) ;
-
Han, Moon-Sup
(Dept. of Physics, University of Seoul)
;
- Park, Kyoung-Wan (Dept. of Nano Science and Technology, University of Seoul)
- Published : 2004.08.19
Abstract
Keywords