Fault Current Limiting Characteristics Dependent on Winding Direction between $1^{st}$ and $2^{nd}$ Winding of Flux-Lock Type SFCL
- Lim, Sung-Hun (School of Electronics&Information Engineering, Chonbuk National Uni.) ;
- Choi, Hyo-Sang (Electrical Engineering Dept. Chosun Uni.) ;
- Lee, Jong-Hwa (School of Electronics&Information Engineering, Chonbuk National Uni.) ;
- Ko, Seok-Cheol (School of Electronics&Information Engineering, Chonbuk National Uni.) ;
- Kang, Hyeong-Gon (Semiconductor Physics Research Center) ;
- Han, Byoung-Sung (School of Electronics&Information Engineering, Chonbuk National Uni.)
- Published : 2003.08.18