Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference (한국전기전자재료학회:학술대회논문집)
- 2003.07a
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- Pages.319-322
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- 2003
Characteristics of Memory Windows of MFMIS Gate Structures
MFMIS 게이트 구조에서의 메모리 윈도우 특성
- Park, Jun-Woong (Department of Electrical Engineering, Korea University) ;
- Kim, Ik-Soo (Korea Institute of Science & Technology) ;
- Shim, Sun-Il (Korea Institute of Science & Technology) ;
- Youm, Min-Soo (Department of Electrical Engineering, Korea University) ;
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Kim, Yong-Tae
(Korea Institute of Science & Technology) ;
- Sung, Man-Young (Department of Electrical Engineering, Korea University)
- 박전웅 (고려대학교 전기공학과) ;
- 김익수 (한국과학기술연구원) ;
- 심선일 (한국과학기술연구원) ;
- 염민수 (고려대학교 전기공학과) ;
-
김용태
(한국과학기술연구원) ;
- 성만영 (고려대학교 전기공학과)
- Published : 2003.07.10
Abstract
To match the charge induced by the insulators