Faillure and Structure Analysis of Optical Recording Media by Microscopy

  • 송인용 (삼성종합기술원 AE Center) ;
  • 박윤찬 (삼성종합기술원 AE Center) ;
  • 백현석 (삼성종합기술원 AE Center) ;
  • 송세안 (삼성종합기술원 AE Center) ;
  • 김은구 (삼성전자 광 Pick-up group)
  • Published : 2001.11.01