한국산업정보학회:학술대회논문집 (Proceedings of the Korea Society for Industrial Systems Conference)
- 한국산업정보학회 2001년도 춘계학술대회논문집:21세기 신지식정보의 창출
- /
- Pages.209-216
- /
- 2001
IEEE 1149.1 구조에서 다중 동적 신호 검출
Detecting the Multiful Dynamic Signals on IEEE 1149.1 Structure
초록
A key advantage of boundary scan technology is the ability to observe data at device inputs and control data at device outputs, independent of on-chip system logic. But, this method has a disadvantage for detecting of faults that changes their states very fast. We present a method to solve this problem and make it possible to detect the signals. We shown the simulation results of testing a circuit that has fast signal above the clock speed.
키워드