An automated measurement system for the microwave surface resistance of high-T$_c$ superconductor films
- Lee, J.H. (Department of physics, Konkuk University) ;
- Lim, J. (Department of physics, Konkuk University) ;
- Lee, Jung-Hun (Department of physics, Konkuk University) ;
- Lee, Sang-Young (Department of physics, Konkuk University)
- Published : 2000.08.16
Abstract
A prototype for a highly sensitive, automated measurement system for the microwave surface resistance of high-T
Keywords
- automated system;
- sapphire-loaded cavity;
- high-T$_c$ superconductor film;
- YBa$_2$Cu$_3$O$_{7-{\delta}}$;
- surface resistance