Proceedings of the Korean Operations and Management Science Society Conference (한국경영과학회:학술대회논문집)
- 2000.04a
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- Pages.381-384
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- 2000
Analysis of Accelerated Life Tests with Intrinsic and Extrinsic Failure Modes
내부고장요인과 외부고장요인이 있는 제품에 대한 가속수명 시험의 분석
- Kim, C. M. (Korea Advanced Institute of Science and Technology, Department of Industrial Engineering) ;
- D. S, Bai (Korea Advanced Institute of Science and Technology, Department of Industrial Engineering)
- Published : 2000.04.01
Abstract
This paper proposes a method of estimating the lifetime distribution at use condition for constant stress accelerated lift tests when extrinsic failure mode as well as intrinsic one exists. A mixture of two log-normal distributions is introduced to describe these failure modes and it is assumed that a linear relation exists between the location parameter and stress. An estimation procedure using the expectation and maximization algorithm is proposed and a numerical example is given.
Keywords