Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference (한국전기전자재료학회:학술대회논문집)
- 1998.11a
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- Pages.141-144
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- 1998
Negative Bias Stress Effect with Offset Structure in Poly-Si TFT's
Offset 구조 Poly-Si TFT의 Negative Bias Stress 효과
Abstract
The electrical characteristics of poly-Si TFT's with offset structure by negative bias stress are systematically investigated as a function of offset length. The changes of electrical characteristics, V
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