The Effect of Thickness and Underlayer on Crystallographic Properties of Co-Cr Thin Films

CoCr 박막의 결정성에 미치는 두께 및 하지층의 영향

  • 최성민 (광운대학교 전기공학과) ;
  • 김재환 (광운대학교 전기공학과) ;
  • 금민종 (경원대학교 전기.전자공학부) ;
  • 김경환 (경원대학교 전기.전자공학부) ;
  • 중천무수 (동경공업대학 전자물리과) ;
  • 직강정언 (동경공업대학 전자물리과)
  • Published : 1998.07.20

Abstract

The c-axis orientation plays a very important role in controlling the main parameters of the perpendicular magnetic recording media, such as perepndicular magnetic anisotropy field $H_{K{\bot}}$, the ratio of coercive force $H_{C{\bot}}/H_{C//}$, the recording density $D_{50}$, and the dispersion of the c-axis orientation $\Delta\theta_{50}$, which is quite important for the performance as perpendicular recording media, as well as the magnetic properties of the film. In this study, the essential process requirement for preparing the Co-Cr films with the superior c-axis orientation, the dependence of $\Delta\theta_{50}$ and the magnetic properties on the film thickness $\delta$, and the effect of underlayer on the dispersion of c-axis orientation have been investigated for both the FTS and DCM system.

Keywords