Effect of Post Plasma Treatment on Water Absorption and Dielectric Properties of Fluorine Doped $SiO_2$ Films Formed by ECRCVD with $SiF_4$ and $O_2$

  • Yoo, Jae-Yoon (Department of Metallurgical Engineering, Hanyang University) ;
  • Lee, Seonghyeong (Department of Metallurgical Engineering, Hanyang University) ;
  • Park, Jong-Wan (Department of Metallurgical Engineering, Hanyang University)
  • Published : 1996.11.01

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