Proceedings of the KIEE Conference (대한전기학회:학술대회논문집)
- 1994.07a
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- Pages.122-124
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- 1994
Introduction to Electromagnetic Nondestructive Testing
전자기 비파괴검사의 소개
- Shin, Young-Kil (Dept. of Electrical Eng., Kunsan National University)
- 신영길 (군산대학교 전기공학과)
- Published : 1994.07.21
Abstract
The purpose of this paper is to attract electrical and electronic engineering community's attention to electromagnetic nondestructive testing (NDT). Various electromagnetic NDT methods of detecting defects in materials are presented to help understand the underlying physics associated with these techniques. This understanding would provide a way to interpret the test signal to describe about the defect. In the meantime, the author hopes, one may realize how perfectly fit such a subject as electromagnetic NDT is to current curriculums of electrical and electronic engineering.
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