Proceedings of the KIEE Conference (대한전기학회:학술대회논문집)
- 1993.07b
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- Pages.1256-1258
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- 1993
The Thermal and Optical Properties of Te-based Antireflection structure for Optical Recording
광기록을 위한 Te-based Antireflection구조의 열적, 광학적 특성
- Lee, S.J. (Dept. of Electronic materials Eng. Kwangwoon Univ.) ;
- Lee, H.Y. (Dept. of Electronic materials Eng. Kwangwoon Univ.) ;
- Chung, H.J. (Dept. of Electronic materials Eng. Kwangwoon Univ.) ;
- Lee, Y.J. (Dept. of Electronic Eng. Yeojoo Technical College)
- Published : 1993.07.18
Abstract
Optical data storage offer high density storage and archival storage capability. In this study, we selected the ablation mechanism-one of an irreversible recording system-using the antireflection trilayer(ART) structure. Optical recording medium is a
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