• Title/Summary/Keyword: x-ray diffraction(XRD)

Search Result 2,640, Processing Time 0.03 seconds

Electrochemical Behavior and Biocompatibility of Co-Cr Dental Alloys

  • Kang, Jung-In;Yoon, Jun-Bin;Choe, Han-Cheol
    • Proceedings of the Korean Institute of Surface Engineering Conference
    • /
    • 2015.05a
    • /
    • pp.107-107
    • /
    • 2015
  • In order to investigate electrochemical behavior and biocompatibility of Co-Cr dental alloy by electrochemical corrosion test and MTT assay, the xCo-25Cr-yW-zNi alloys were used in this study. Samples of Co-Cr-W-Ni alloys were manufactured using arc melting furnace. The microstructure of the alloys was examined by optical microscopy (OM), Field emission scanning electron microscopy (FE-SEM), energy dispersive X-ray spectroscopy (EDS), X-ray diffraction (XRD), MTT assay, and corrosion test. Corrosion resistance increased slightly as cobalt (Co) content increased. And bioactivity was concerned with nickel (Ni) and tungsten (W). Biocompatibility of Co-Cr alloy depended on Ni and W contents.

  • PDF

Characterization and Conversion Electron Mössbauer Spectroscopy of HoMn1-x-FexO3 Thin Films by Pulsed Laser Deposition (PLD를 이용한 HoMn1-x-FexO3 박막 제조 및 후방 산란형 뫼스바우어 분광 연구)

  • Choi, Dong-Hyeok;Shim, In-Bo;Kim, Chul-Sung
    • Journal of the Korean Magnetics Society
    • /
    • v.17 no.1
    • /
    • pp.18-21
    • /
    • 2007
  • The hexagonal $HoMn_{1-x}-Fe_xO_3$(x=0.00, 0.05) thin films were prepared using pulsed laser deposition(PLD) method on $Pt/Ti/SiO_2/Si$ substrate. The microstructure and magnetic properties have been studied by x-ray diffraction(XRD), atomic force microscopy (AFH), scanning electron microscope(SEM:), x-ray photoelectron spectroscopy(XPS), and conversion electron $M\"{o}ssbauer$ spectroscopy(CEMS). From the analysis of the x-ray diffraction patterns, the crystal structure for all films was found to be a hexagonal($P6_3cm$), which was preferentially grown along(110) direction. The lattice constant $c_0$ of the film with x=0.05 was close to that of single crystal, whereas lattice constant $a_0$ with respect to single crystal shows a slight decrease. This difference of lattice parameters between film and single crystal was caused by the lattice mismatch between the film and $Pt/Ti/SiO_2/Si$ substrate. Conversion electron $M\"{o}ssbauer$ spectrum of $HoMn_{0.95}Fe_{0.05}O_3$ thin film shows an asymmetry doublet absorption ratio at room temperature, which is due to the oriented direction of crystallographic domains. This is corresponding with analysis of x-ray diffraction. The quadrupole splitting(${\Delta}E_Q$) at room temperature is found to be $1.62{\pm}0.01mm/s$. This large ${\Delta}E_Q$ was caused by asymmetry environment surrounding Fe ion.

Digital X-ray Detector에 적용을 위한 Polycrystalline CdTe 구조에 따른 전기적 신호 연구

  • Kim, Jin-Seon;O, Gyeong-Min;Jo, Gyu-Seok;Song, Yong-Geun;Hong, Ju-Yeon;Heo, Seung-Uk;Nam, Sang-Hui
    • Proceedings of the Korean Vacuum Society Conference
    • /
    • 2013.02a
    • /
    • pp.484-484
    • /
    • 2013
  • 기존 진단용 Digital X-ray Detector이 직접방식에서는 a-Se (Amorphous Selenium)이 대중화되었지만 고전압을 인가하여야한다는 점과 그로 인한 물질 자체의 Life time 감소 등 여러 단점들 때문에 기타 후보물질들로 HgI2, PbI2, PbO, CdTe, CdZnTe가 연구 되고 있다. 이러한 후보 물질들 중 본 연구에서는 PVD (Physical Vapor Deposition)방식을 이용하여 Polycrystalline CdTe 박막을 제작하고 특성 향상을 위해 유전물질을 Passive layer와 Protect layer로써 증착하였다. 또한 유전체층의 위치에 따른 특성 분석을 위해 제작된 박막은 FE-SEM (Field Emission Scanning Electron Microscope), XRD (X-ray Diffraction)을 통해 구조적인 특성을 확인하였다. 그리고 입사되는 X-ray 선량에 의해 생성되는 전기적 특성을 분석하였다, 그 결과 박막의 Grain Size는 약 $5{\mu}M$이며 (111)방향의 주 peak를 띄는 Poly CdTe형태로 증착된 것을 확인하였다. 전기적인 신호 결과 Passive layer와 Protect layer를 증착한 박막 모두 Darkcurrent가 감소된 것을 확인하였다. 또한 Sensitivity 측정 결과 Passive layer를 삽입한 경우 신호 값이 감소하였으며 Protect layer를 삽입한 경우 신호 값의 변화가 일어나지 않았다. 그러므로 Protect layer를 등착한 박막의 경우 SNR이 현저히 높아지는 결과를 낳았다.

  • PDF

Flame Retardancy and Physical Properties of Polyurethane Foam with Expandable Graphite (팽창 흑연을 포함한 폴리우레탄 폼의 난연 및 물성 변화 연구)

  • Bae, Sung-Jun;Park, Ji-Hyeon;Go, Jae-Wang;Choi, Pil-Jun;Lee, Jae-Yeon;Sur, Suk-Hun
    • Journal of Adhesion and Interface
    • /
    • v.20 no.3
    • /
    • pp.96-101
    • /
    • 2019
  • In this study, the flame retardant and physical properties of the expandable graphite/polyurethane foam composites were considered by the addition of expandable graphite. The tensile strength of expandable graphite/polyurethane foam composites decreased with the content of the expandable graphite and the analysis of cell shape by SEM has shown that as the expandable graphite content increases, the cell becomes uneven and collapses. As the results of the compressive strength, density and air permeability tests, it was found that density and as the content of the expandable graphite increased, the compressive strength of the composites increased but air permeability decreased. When the amount of expandable graphite was added at 10 phr or higher, the foam has excellent flame retardation performance. Analysis of the degree of diffraction by X-ray diffraction (XRD) showed that as the content of the expandable graphite increased, the crystal peak of the graphite appeared near $2{\theta}=26^{\circ}$.

Structural properties of GeSi/Si heterojunction compound semiconductor films by using SPE (SPE법을 통해 형성된 $Ge_xSi_{1-x}/Si$이종접합 화합물 반도체의 결정분석)

  • 안병열;서정훈
    • Journal of the Korea Institute of Information and Communication Engineering
    • /
    • v.4 no.3
    • /
    • pp.713-719
    • /
    • 2000
  • In order to Prepare the$Ge_xSi_{1-x}/Si$(111) heterosructure by solid phase epitaxy (SPE), about 1000A of Au and about 1000A Ge were sequentially deposited on the Si(111) substrate. The resulting Ge/Au/Si(111) samples were isochronically annealed in the high vacuum condition. The behaviors of Au and Ge during thermal annealing and the structural Properties of $Ge_xSi_{1-x}$ films were characterized by Auger electron spectroscopy (AES), X-ray diffraction (XRD) and high resolution transmission electron microscopy (TEM). The a-Ge/Au/Si(111) structure was converted to the Au/GeSi/Si(111) structure. Defects such as stacking faults, point defects and dislocations were found at the GeXSil-X(111) interface, but the film was grown epitaxially with the matching face relationship of $Ge_xSi_{1-x}/$(111)/Si(111). Twin crystals were also found in the $Ge_xSi_{1-x}/$(111) matrix.

  • PDF

Glass Forming Stability in Chalcogenide-based GeSbSe Materials for IR-Lens (적외선 렌즈용 Ge-Sb-Se계 칼코게나이드의 유리안정성 평가)

  • Jung, Gun-Hong;Kong, Heon;Yeo, Jong-Bin;Lee, Hyun-Yong
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
    • /
    • v.30 no.4
    • /
    • pp.204-209
    • /
    • 2017
  • Thermal and structural stability in the glass transition region of chalcogenide glasses has been investigated in terms of thermodynamics for application to various optoelectronic devices. In this study, the compositions of $Ge_xSb_{20}Se_{80-x}$ (x = 10, 15, 20, 25, and 30) were selected to investigate the glass stability according to germanium ratios. The chalcogenide bulks were fabricated by using a traditional melt-quenching method. Thin films were deposited by a thermal evaporation system, maintaining the deposition ratio of $3{\sim}5{\AA}$ in order to have uniformity. The thermal and structural properties were measured by a differential scanning calorimeter (DSC) and X-ray diffraction (XRD). The DSC analysis provided thermal parameters and theoretical glass region stabilities. The XRD analysis supported the theoretical stabilities because of where the crystallization peak data occurred.

The Structural and Optical Properties with Composition Variation of CdxZn1-xO Thin Films Prepared by Sol-Gel Method (Sol-Gel 방법으로 제작된 CdxZn1-xO 박막의 조성비에 따른 구조적 및 광학적 특성)

  • Cheon, Min Jong;Kim, Soaram;Nam, Giwoong;Yim, Kwang Gug;Kim, Min Su;Leem, Jae-Young
    • Korean Journal of Metals and Materials
    • /
    • v.49 no.7
    • /
    • pp.583-588
    • /
    • 2011
  • $Cd_xZn_{1-x}O$ thin films were grown on quartz substrates by using the sol-gel spin-coating method. The mole fraction, x, of the $Cd_xZn_{1-x}O$ thin films was controlled from 0 to 1 by changes in the content ratio of the cadmium acetate dehydrate [$Cd{(CH_3COO)}_2{\cdot}2H_2O$] and zinc acetate dehydrate [$Zn{(CH_3COO)}_2{\cdot}2H_2O$]. The effects of the mole fraction on the morphological, structural, and optical properties of the $Cd_xZn_{1-x}O$ thin films were investigated by scanning electron microscopy (SEM), X-ray diffraction (XRD), and UV-visible spectroscopy. The $Cd_xZn_{1-x}O$ thin films exhibited the polygonal surface morphology and their grain size was increased ranging from 42.1 to 63.9 nm with the increase in the mole fraction. It was observed that the absorption bandgap of the $Cd_xZn_{1-x}O$ thin films decreased from 3.25 to 2.16 eV as the mole fraction increased and the Urbach energy ($E_U$) values changed inversely to the optical bandgap of the $Cd_xZn_{1-x}O$ thin films.

Physicochemical Properties of Calcium Phosphate Thin Films Prepared in the Presence of Magnesium and Its Effects on Cellular Proliferation (마그네슘 존재 하에 형성된 칼슘포스페이트 박막의 물리화학적 특성과 세포증식에 미치는 영향)

  • Shin, Hyun-Young;Lee, Woo-Kul
    • Applied Chemistry for Engineering
    • /
    • v.18 no.3
    • /
    • pp.262-266
    • /
    • 2007
  • The effect of the presence of magnesium ions in the preparation of calcium phosphate (CP) thin films on the physicochemical and biological properties of the films has been investigated in this study. Five different surfaces were used and the culture plate (CTL) and CP film prepared in the absence of magnesium (CaP) were used for the comparison. Three different films were prepared at different magnesium concentrations. CP films prepared at the Mg concentrations of 0.1, 1, and 10 mM were designated as CaPL, CaPM, and CaPH, respectively. The observation of surface morphology of the CP films using scanning electron microscopy (SEM) displayed that the presence of magnesium affected considerably the morphology of the films including a decrease of surface porosity. X-ray diffraction (XRD) analysis for the determination of the crystallinity of the CP films showed that the structure of the films was amorphous. Examination using X-ray photoelectron spectroscopy (XPS) confirmed the prepared films consisted of calcium, phophorus, and magnesium. Cell adhesion assays elucidated that cell adhered less as the magnesium concentration increased. However, cell proliferation assays demonstrated that the cells proliferated more actively on the films prepared at the higher magnesium concentration. These results suggest that the presence of magnesium may promote the biocompatibility of CP films.

The properties of AlGaN epi layer grown by HVPE (HVPE에 의해 성장된 AlGaN epi layer의 특성)

  • Jung, Se-Gyo;Jeon, Hun-Soo;Lee, Gang-Seok;Bae, Seon-Min;Yun, Wi-Il;Kim, Kyoung-Hwa;Yi, Sam-Nyung;Yang, Min;Ahn, Hyung-Soo;Kim, Suck-Whan;Yu, Young-Moon;Cheon, Seong-Hak;Ha, Hong-Ju
    • Journal of the Korean Crystal Growth and Crystal Technology
    • /
    • v.22 no.1
    • /
    • pp.11-14
    • /
    • 2012
  • The AlGaN layer has direct wide bandgaps ranging from 3.4 to 6.2 eV. Nowadays, it is becoming more important to fabricate optical devices in an UV region for the many applications. The high quality AlGaN layer is necessary to establish the UV optical devices. However, the growth of AlGaN layer on GaN layer is difficult due to the lattice mismatch and difference thermal expansion coefficient between GaN layer and AlGaN layer. In this paper, we attempted to grow the LED structure on GaN template by mixed-source HVPE method with multi-sliding boat system. We tried to find the optical and lattice transition of active layer by control the Al content in mixed-source. For the growth of epi layer, the HCl and $NH_3$ gas were flowed over the mixed-source and the carrier gas was $N_2$. The temperature of source zone and growth zone was stabled at 900 and $1090^{\circ}C$, respectively. After the growth, we performed the x-ray diffraction (XRD) and electro luminescence (EL) measurement.

Composition Dependence on Structural and Optical Properties of MgxZn1-xO Thin Films Prepared by Sol-Gel Method

  • Kim, Min-Su;Noh, Keun-Tae;Yim, Kwang-Gug;Kim, So-A-Ram;Nam, Gi-Woong;Lee, Dong-Yul;Kim, Jin-Soo;Kim, Jong-Su;Leem, Jae-Young
    • Bulletin of the Korean Chemical Society
    • /
    • v.32 no.9
    • /
    • pp.3453-3458
    • /
    • 2011
  • The $Mg_xZn_{1-x}O$ thin films with the various content ratio ranging from 0 to 0.4 were prepared by sol-gel spincoating method. To investigate the effects of content ratio on the structural and optical properties of the $Mg_xZn_{1-x}O$ thin films, scanning electron microscopy (SEM), X-ray diffraction (XRD), and photoluminescence (PL) were carried out. With increase in the content ratio, the grain size of the $Mg_xZn_{1-x}O$ thin films was increased, however, at the content ratio above 0.2, MgO particles with cubic structure were formed on the surface of the $Mg_xZn_{1-x}O$ thin films, indicating that the Mg content exceeded its solubility limit in the thin films. The residual stress of the $Mg_xZn_{1-x}O$ thin films is increased with increase in the Mg mole fraction. In the PL investigations, the bandgap and the activation energy of the $Mg_xZn_{1-x}O$ thin films was increased with the Mg mole fraction.