• Title/Summary/Keyword: wide field microscopy

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A Quantitative Study of the Quality of Deconvolved Wide-field Microscopy Images as Function of Empirical Three-dimensional Point Spread Functions

  • Adur, Javier;Vicente, Nathalie;Diaz-Zamboni, Javier;Izaguirre, Maria Fernanda;Casco, Victor Hugo
    • Journal of the Optical Society of Korea
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    • v.15 no.3
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    • pp.252-263
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    • 2011
  • In this work, for the first time, the quality of restoration in wide-field microscopy images after deconvolution was analyzed as a function of different Point Spread Functions using one deconvolution method, on a specimen of known size and on a biological specimen. The empirical Point Spread Function determination can significantly depend on the numerical aperture, refractive index of the embedding medium, refractive index of the immersion oil and cover slip thickness. The influence of all of these factors is shown in the same article and using the same microscope. We have found that the best deconvolution results are obtained when the empirical PSF utilized is obtained under the same conditions as the specimen. We also demonstrated that it is very important to quantitatively check the process' outcome using several quality indicators: Full-Width at Half-Maximum, Contrast-to-Noise Ratio, Signal-to-Noise Ratio and a Tenengrad-based function. We detected a significant improvement when using an indicator to measure the focus of the whole stack. Therefore, to qualitatively determinate the best deconvolved image between different conditions, one approach that we are pursuing is to use Tenengrad-based function indicators in images obtained using a wide-field microscope.

Flow Visualization of Magnetic Particles under the external magnetic field in bubbly flow using Single Plane Illumination Microscopy - MicroPIV (Single Plane Illumination Microscopy - MicroPIV를 이용한 버블 유동에서 외부 자계 영향을 받는 자성입자 가시화)

  • Lee, Changje;Cho, Gyeong-rae;Lee, Sangyoup
    • Journal of the Korean Society of Visualization
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    • v.19 no.1
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    • pp.36-42
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    • 2021
  • This study measured the velocity of magnetic particles inside the power generation using external heat sources. Single Plane Illumination Microscopy (SPIM) was used to measure magnetic particles that are simultaneously affected by bubbly flow and magnetic field. It has the advantage of reducing errors due to particle superposition by illuminating the thin light sheet. The hydraulic diameter of the power generation is 3mm. Its surface is covered with a coil with a diameter of 0.3 mm. The average diameter of a magnetic particle is 200nm. The excitation and emission wavelengths are 530 and 650nm, respectively. In order to find out the flow characteristics, a total of four velocity fields were calculated in wide and narrow gap air bubbles, between the wall and the air bubble and just below the air bubble. Magnetic particles showed up to 8.59% velocity reduction in the wide gap between air bubbles due to external magnetic field.

High-speed Three-dimensional Surface Profile Measurement with the HiLo Optical Imaging Technique

  • Kang, Sewon;Ryu, Inkeon;Kim, Daekeun;Kauh, Sang Ken
    • Current Optics and Photonics
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    • v.2 no.6
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    • pp.568-575
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    • 2018
  • Various techniques to measure the three-dimensional (3D) surface profile of a 3D micro- or nanostructure have been proposed. However, it is difficult to apply such techniques directly to industrial uses because most of them are relatively slow, unreliable, and expensive. The HiLo optical imaging technique, which was recently introduced in the field of fluorescence imaging, is a promising wide-field imaging technique capable of high-speed imaging with a simple optical configuration. It has not been used in measuring a 3D surface profile although confocal microscopy originally developed for fluorescence imaging has been adapted to the field of 3D optical measurement for a long time. In this paper, to the best of our knowledge, the HiLo optical imaging technique for measuring a 3D surface profile is proposed for the first time. Its optical configuration and algorithm for a precisely detecting surface position are designed, optimized, and implemented. Optical performance for several 3D microscale structures is evaluated, and it is confirmed that the capability of measuring a 3D surface profile with HiLo optical imaging technique is comparable to that with confocal microscopy.

Local oxidation of 4H-SiC using an atomic force microscopy (Atomic Force Microscopy을 이용한 4H-SiC의 Local Oxidation)

  • Jo, Yeong-Deuk;Bahng, Wook;Kim, Sang-Cheol;Kim, Nam-Kyun;Koo, Sang-Mo
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2009.04b
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    • pp.79-80
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    • 2009
  • The local oxidation using an atomic force microscopy (AFM) is useful for Si-base fabrication of nanoscale structures and devices. SiC is a wide band-gap material that has advantages such as high-power, high-temperature and high-frequency in applications, and among several SiC poly types, 4H-SiC is the most attractive poly type due to the high electron mobility. However, the AFM local oxidation of 4H-SiC for fabrication is still difficult, mainly due to the physical hardness and chemical inactivity of SiC. In this paper, we investigated the local oxidation of 4H-SiC surface using an AFM. We fabricated oxide patterns using a contact mode AFM with a Pt/Ir-coated Si tip (N-type, $0.01{\sim}0.025\;{\Omega}cm$) at room temperature, and the relative humidity ranged from 40 to 50%. The height of the fabricated oxide pattern ($1{\sim}3\;nm$) on SiC is similar to that of typically obtained on Si ($10^{15}{\sim}10^{17}\;cm^{-3}$). We perform the 2-D simulation to further analyze the electric field between the tip and the surface. Whereas the simulated electric field on Si surface is constant ($5\;{\times}\;10^7\;V/m$), the electric field on SiC surface increases with increasing the doping concentration from ${\sim}10^{15}$ to ${\sim}10^{17}\;cm^{-3}$. We demonstrated that a specific electric field ($4\;{\times}\;10^7\;V/m$) and a doping concentration (${\sim}10^{17}\;cm^{-3}$) is sufficient to switch on/off the growth of the local oxide on SiC.

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Atomic Force Microscopy (AFM) Tip based Nanoelectrode with Hydrogel Electrolyte and Application to Single-Nanoparticle Electrochemistry

  • Kyungsoon Park;Thanh Duc Dinh;Seongpil Hwang
    • Journal of Electrochemical Science and Technology
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    • v.15 no.2
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    • pp.261-267
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    • 2024
  • An unconventional fabrication technique of nanoelectrode was developed using atomic force microscopy (AFM) and hydrogel. Until now, the precise control of electroactive area down to a few nm2 has always been an obstacle, which limits the wide application of nanoelectrodes. Here, the nanometer-sized contact between the boron-doped diamond (BDD) as conductive AFM tip and the agarose hydrogel as solid electrolyte was well governed by the feedback amplitude of oscillation in the non-contact mode of AFM. Consequently, this low-cost and feasible approach gives rise to new possibilities for the fabrication of nanoelectrodes. The electroactive area controlled by the set point of AFM was investigated by cyclic voltammetry (CV) of the ferrocenmethanol (FcMeOH) combined with quasi-solid agarose hydrogel as an electrolyte. Single copper (Cu) nanoparticle was deposited at the apex of the AFM tip using this platform whose electrocatalytic activity for nitrate reduction was then investigated by CV and Field Emission-Scanning Electron Microscopy (FE-SEM), respectively.

Characterization of Nanoscale Electroactive Polymers via Piezoelectric Force Microscopy

  • Lee, Su-Bong;Ji, Seungmuk;Yeo, Jong-Souk
    • Proceedings of the Korean Vacuum Society Conference
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    • 2015.08a
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    • pp.232.2-232.2
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    • 2015
  • Piezoelectric force microscopy (PFM) is a powerful method to characterize inversed piezoelectric effects directly using conductive atomic force microscopy (AFM) tips. Piezoelectric domains respond to an applied AC voltage with a characteristic strain via a contact between the tip and the surface of piezoelectric material. Electroactive piezoelectric polymers are widely investigated due to their advantages such as flexibility, light weight, and microactuation enabling various device features. Although piezoelectric polymers are promising materials for wide applications, they have the primary issue that the piezoelectric coefficient is much lower than that of piezoelectric ceramics. Researchers are studying widely to enhance the piezoelectric coefficient of the materials including nanoscale fabrication and copolymerization with some materials. In this report, nanoscale electroactive polymers are prepared by the electrospinning method that provides advantages of direct poling, scalability, and easy control. The main parameters of the electrospinning process such as distance, bias voltage, viscosity of the solution, and elasticity affects the piezoelectric coefficient and the nanoscale structures which are related to the phase of piezoelectric polymers. The characterization of such electroactive polymers are conducted using piezoelectric force microscopy (PFM). Their morphologies are characterized by field emission-scanning electron microscope (FE-SEM) and the crystallinity of the polymer is determined by X-ray diffractometer.

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Scientific and Engineering Applications of Full-field Swept-source Optical Coherence Tomography

  • Mehta, Dalip Singh;Anna, Tulsi;Shakher, Chandra
    • Journal of the Optical Society of Korea
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    • v.13 no.3
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    • pp.341-348
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    • 2009
  • We report the development of full-field swept-source optical coherence tomography (SS-OCT) in the wavelength range of 815-870 nm using a unique combination of super-luminescent diode (SLD) as broad-band light source and acousto-optic tunable filter (AOTF) as a frequency-scanning device. Some new applications of full-field SS-OCT in forensic sciences and engineering materials have been demonstrated. Results of simultaneous topography and tomography of latent fingerprints, silicon microelectronic circuits and composite materials are presented. The main advantages of the present system are completely non-mechanical scanning, wide-field, compact and low-cost.

Flexure hinge mechanism having amplified rectilinear motion for confocal scanning microscopy using optical section

  • Kwon, Oh-Kyu;Park, Poo-Gyeon
    • 제어로봇시스템학회:학술대회논문집
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    • 2001.10a
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    • pp.162.6-162
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    • 2001
  • Confocal scanning microscopy (CSM) is an important instrument in a wide variety of imaging applications because of its ability to provide three-dimensional images of thick, volume specimens. The mechanism for two-dimensional beam scanning and optical sectioning has an important roe in CSM as the three-dimensional profiler. This optical sectioning property arises from the use of a point detector, which serves to attenuate the signals from out-of-focus. The intensity profile for the open loop scanning should be matched with its response for the standard. The non-linearity can be minimized with the optical sectioning or the optical probe of the closed loop control. This paper shows the mathematical expression of the light such as the extinction curve in the optical fields of system using AO deflector, the axial/lateral response experimentally when the error sources change, and the methods of optical sectioning. Thorough design of optical sectioner is crucial to the success of CSM in the field ...

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Shaded-Mask Filtering for Extended Depth-of-Field Microscopy

  • Escobar, Isabel;Saavedra, Genaro;Martinez-Corral, Manuel;Calatayud, Arnau;Doblas, Ana
    • Journal of information and communication convergence engineering
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    • v.11 no.2
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    • pp.139-146
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    • 2013
  • This paper proposes a new spatial filtering approach for increasing the depth-of-field (DOF) of imaging systems, which is very useful for obtaining sharp images for a wide range of axial positions of the object. Many different techniques have been reported to increase the depth of field. However the main advantage in our method is its simplicity, since we propose the use of purely absorbing beam-shaping elements, which allows a high focal depth with a minimum modification of the optical architecture. In the filter design, we have used the analogy between the axial behavior of a system with spherical aberration and the transverse impulse response of a 1D defocused system. This allowed us the design of a ring-shaded filter. Finally, experimental verification of the theoretical statements is also provided.