• Title/Summary/Keyword: trasonic Pulse

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The Quantitative Analysis of the Superposed Ultrasonic Signal by PD Sources in a Transformer (부분방전원에 의해 중첩된 초음파신호의 정량적분석)

  • 송현석;구교선;이동준;곽희로
    • Proceedings of the Korean Institute of IIIuminating and Electrical Installation Engineers Conference
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    • 2001.11a
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    • pp.163-166
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    • 2001
  • In this paper, the superposition of ultrasonic signals which were generated by multi-source in a transformer was presented. For analysis of ultrasonic superposition, V$_{peak-peak}$ and pulse number of ultra-sonic signal were used. As a result, the wave form of ultrasonic superposition was classified into three types ; First type was the wave form whose V$_{peak-peak}$ was increased by the superposition of each signal's V$_{peak-peak}$. Second type was wave form whose V$_{peak-peak}$ was decreased by the superposition of each signal's V$_{peak-peak}$. And the other type was wave form whose peals were two or mere. And V$_{peak-peak}$ of superposed ultrasonic wave wads mostlv increased or decreased and pulse number of supe게osed u1trasonic wave was mostly increased.y increased.

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Quantitative Evaluation of Flaw by Ultrasonic Spectroscopy (초음파 주파수 분석법에 의한 결함의 정량적 평가에 관한 연구)

  • 한응교;김성규;박준서;이범성;박익근
    • Transactions of the Korean Society of Mechanical Engineers
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    • v.16 no.5
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    • pp.1004-1010
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    • 1992
  • In recent years, along with the development of ultrasonic probe with wide frequency range, the digitization of measuring instrument, and the development of operating process technics, it is possible to analyze ultrasonic pulse in frequency range. In this paper, applying to flaw model the ultrasonic spectroscopy method that can analyze ultrassonic pulse in frequency range, we examine the possibility of quantification of flaw and apply its result to the void and seperation in LSI package. Consequently, by using the change in frequency distribution and central frequency of sltrasonic pulse detected from flaw, the estimation of shape, size, and depth of flaw is possible. The change in central frequency is changed minutely by the sample materals and position of flaw, but changed mainly by the shape and size of flaw. And we can quantify the shape and size of flaw in LSI pakcage using the experimental result through flaw model.